Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for processing radio-frequency plasma

A radio frequency plasma, plasma technology, applied in the fields of plasma, chemical/physical/physical chemical process of applied energy, semiconductor/solid-state device manufacturing, etc., can solve the problem of insufficient RF energy coupling, can not be ignored, plasma stability issues

Inactive Publication Date: 2003-09-24
ANELVA CORP
View PDF0 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0012] However, from the research of the inventors, the fact that the use of two different frequencies, for example in the VHF band and the HF band, brings about some problems that cannot be ignored
Specifically, it poses the problem that the plasma cannot be well maintained because the coupling of the RF energy to the plasma becomes insufficient, and that the plasma becomes unstable in its initial state

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for processing radio-frequency plasma
  • Method and system for processing radio-frequency plasma
  • Method and system for processing radio-frequency plasma

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] Preferred embodiments of the present invention will be described as follows. figure 1 is a schematic cross-sectional front view of a radio frequency plasma processing system as a first embodiment of the present invention. as in figure 1 The system shown in includes a processing chamber 1 with a pump conduit 11, a processing gas introduction pipe 2 for introducing a processing gas into the processing chamber 1, for generating a plasma in the processing chamber 1 by causing a radio frequency discharge with the introduced processing gas A plasma generating device, and a substrate holder 5 for supporting the substrate 9 at a desired position for processing the substrate 9 with the generated plasma.

[0039] The plasma generating device includes a radio frequency electrode 3, and a radio frequency power source 4 for applying a radio frequency voltage to the radio frequency electrode 3 to thereby generate plasma. The radio frequency power supply 4 is hereinafter referred to...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present application discloses a technology of radio frequency plasma treatment using radio frequency waves of two different frequencies, in which plasma can be sufficiently and stably generated and maintained. The first frequency is used to generate a plasma by inducing a discharge, and the second frequency is used to generate a self-bias voltage on the substrate being processed. The wave of the second frequency is applied with a time lag after the application of the radio frequency wave of the first frequency. The present application also discloses impedance matching techniques in radio frequency plasma processing in which the impedance provided is optimized for inducing discharge and stabilizing the plasma.

Description

technical field [0001] The present invention relates to processes utilizing plasmas generated by radio frequency (RF) waves. In particular, the present invention relates to processes that simultaneously utilize radio frequency waves of different frequencies. Background technique [0002] The process of using plasma generated by the energy of radio frequency waves is very practical in the manufacture of semiconductor devices such as large scale integration (LSI) and display devices such as liquid crystal displays (LCD), and this process is hereinafter referred to as It is called "RF plasma process" or "RF plasma treatment". In such processes, higher frequency radio frequency waves like in very high frequency (VHF), ie 30 MHz to 300 MHz, have been used more often. This point will be described later. [0003] One reason for using higher frequency waves is the need to reduce the pressure in the process. The requirement to reduce the process pressure is closely related to the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H05H1/46B01J19/08C23C16/505H01J7/24H01J37/32H01L21/205H01L21/302H01L21/3065H05H1/18
CPCC23C16/505H01J37/32082H01J37/32165H05H1/18
Inventor 土屋信昭佐护康实池田真义
Owner ANELVA CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products