Unlock instant, AI-driven research and patent intelligence for your innovation.

Semiconductor integrated circuit electronic apparatus and back grid potential control method of transistor

An integrated circuit and potential control technology, which is applied in the manufacture of semiconductor/solid-state devices, semiconductor devices, transistors, etc., and can solve the problems of increased leakage current, increased circuit scale, and inability to reduce leakage current.

Inactive Publication Date: 2004-10-20
SEIKO EPSON CORP
View PDF1 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, in the above-mentioned conventional technology, since the control of the back gate potential of the switching transistor is performed in all circuits on the chip, or in each relatively large circuit block such as a CPU core or a coprocessor, there is a problem that it cannot be used Due to the fine control to reduce the leakage current, the leakage current during standby increases and the power consumption increases when the circuit is viewed as a whole.
In addition, the larger the scale of the circuit to be controlled, the more time it takes to stabilize the potential at the time of switching the back gate potential, and there is a problem of lagging in the transition from the standby state to the operating state.
Furthermore, in the above-mentioned prior art, although the control for cutting off the power supply of the circuit block is performed to reduce the leakage current at this time, if the power supply of the circuit block is cut off, the circuit block cannot maintain its internal state.
Therefore, for example, when a circuit block is constituted by a sequential logic circuit, it is necessary to perform an initial setting or reset setting of the sequential logic circuit when the circuit block is shifted from the standby state to the operating state. Disadvantages such as delay in moving to the action state

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor integrated circuit electronic apparatus and back grid potential control method of transistor
  • Semiconductor integrated circuit electronic apparatus and back grid potential control method of transistor
  • Semiconductor integrated circuit electronic apparatus and back grid potential control method of transistor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach 1

[0041] figure 1 It is a block diagram of a system in which the master unit collectively controls the back gate potentials of a plurality of circuit blocks. The semiconductor integrated circuit in the VLSI chip is divided into M circuit blocks (logic blocks) 20-1, 20-2, . In order to reduce the power consumption of the entire VLSI chip, it is desirable to divide it into a plurality of circuit blocks classified by function. The main unit (control circuit) 10 is an event-driven system, which adopts the logic design level of VLSI to construct the data flow and control logic for unified and centralized control of these circuit blocks 20-1, 20-2, ..., 20-M .

[0042] figure 2 It is a state transition diagram of a finite state machine (Finite State Machine) that realizes the back gate potential control logic of the main unit 10 . The standby state of M circuit blocks 20-1, 20-2, ..., 20-M corresponds to "0", and the operating state corresponds to "1". If the finite state machine...

Embodiment approach 2

[0060] Figure 11 It is a block diagram of a system in which a plurality of circuit blocks constituting a semiconductor integrated circuit communicate with each other and control the back gate potential autonomously or heterogeneously using the CSP (Communicating Sequential Processes) method. The semiconductor integrated circuit in the VLSI chip is logically divided into N circuit blocks (logic blocks) 70-1, 70-2, . N. In order to reduce the power consumption of the entire VLSI chip, it is desirable to divide it into a plurality of circuit blocks classified by function. These circuit blocks 70-1, 70-2, . 70-2, ..., 70-N are asynchronous systems that receive power supply and operate when it is necessary to operate autonomously or heterogeneously. The main unit 60 (control circuit) is mainly a circuit block that performs direct or indirect communication with external circuits and circuit blocks 70-1, 70-2, . A component that directly controls power supply to the circuit bloc...

Embodiment approach 3

[0071] Figure 14 and Figure 15 The middle indicates a double-gate TFT (Thin Film Transistor) 100 . Figure 14 is a top view, Figure 15 It is a sectional view along its line 15-15. A back gate electrode 103 is formed on the insulating substrate 101 via an underlayer 102 . As the insulating substrate 101, for example, a glass substrate, a quartz substrate, a plastic substrate, or the like can be used. On the top of the back gate electrode 103 and the bottom layer 102, a back gate insulating film 104, an active layer 110, a gate insulating film 111, a gate electrode 112, and an interlayer insulating film 115 are laminated in sequence. The active layer 110 is made of island-shaped polysilicon or the like, and includes a channel region 105 formed between upper and lower gates, and drain regions 106 and source regions 107 formed on both sides thereof. The back gate electrode 103 and the gate electrode 112 are disposed opposite to each other with the channel region 105 sandwi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

This invention has as objects the realization of reduced power consumption in a semiconductor integrated circuit, as well as faster transitions of circuits from a standby state to an operating state. In order to achieve these objects, a semiconductor integrated circuit of this invention comprises a plurality of circuit blocks capable of transitions from an operating state to a standby state and from a standby state to an operating state, and a master unit which controls, in event-driven fashion, the back-gate voltages of transistors forming logic elements of the circuit blocks, based on a finite state machine which stipulates in advance each of the state transitions of the plurality of circuit blocks.

Description

technical field [0001] The present invention relates to a technique for controlling the back gate potential of a transistor for realizing low power consumption of a semiconductor integrated circuit. Background technique [0002] JP-A-9-83335 discloses a technique of dividing a VLSI (Very Large Scale Integration: Very Large Scale Integration) circuit into a plurality of circuit blocks, and at least one of a common power supply line or a common ground power line A switching transistor is arranged between the circuit block and the circuit block, and when the circuit block is in a standby state, the potential of the back gate is controlled so that the threshold voltage of the switching transistor rises to turn off the switching transistor. By using this technology, the leakage current (off current) in the standby state can be reduced, and the power consumption can be reduced. [0003] However, in the above-mentioned conventional technology, since the control of the back gate po...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/822G11C7/20H01L21/336H01L21/8238H01L27/04H01L27/08H01L27/092H01L29/786H03K19/00
CPCG11C2207/2227G11C7/20B23Q16/028B23Q2220/004
Inventor 唐木信雄
Owner SEIKO EPSON CORP