X-ray LED imaging device having time solution

An imaging device and time-resolved technology, which is applied in the field of X-ray imaging, can solve the problems of low monochromatic brightness, limited synchrotron radiation devices, and impracticality, and achieve the effect of strong penetrating ability and good monochromaticity

Inactive Publication Date: 2005-01-12
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Abstract
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Problems solved by technology

The synchrotron radiation source, as mentioned above, requires a series of complex devices to synchronize the X-ray pulses with the pump light pulses, which is difficult for ordinary laboratories to achieve, and the current synchrotron radiation in the world Devices are also extremely limited
[0009] Thomson scattering also requires a bulky accelerator, so these devices are not practical
However, laser plasma X-ray sources are often mixed with continuous wave and characteristic spectrum, and the monochromatic brightness is low. This requires people to find new ultra-fast and ultra-hard X-ray sources.

Method used

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  • X-ray LED imaging device having time solution

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Embodiment Construction

[0027] see first figure 1 , figure 1 It is a schematic diagram of an embodiment of the time-resolved photocathode X-ray diode imaging device of the present invention. It can be seen from the figure that the time-resolved photocathode X-ray diode imaging device of the present invention includes a picosecond krypton fluoride laser light source 1, which is characterized in that A beam splitter 2 is placed on the laser output optical path of the second krypton fluoride laser source 1, and the beam splitter 2 divides the incident beam into a reflected A beam and a transmitted B beam, and three mirrors 3, 4, 5 are arranged on the reflected optical path The optical delay line, the concave reflective lens 7 and the sample 10 are formed. After passing through the optical delay line, the A light beam is converged by the concave reflective lens 7 and then interacts with the sample 10, and a reflective mirror 6, a photocathode X-ray diode are arranged on the transmission optical path 8. ...

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Abstract

Beam splitter is setup on laser output path from krypton fluoride laser in picosecond. Incident beam is divided by the splitter into reflection beam A and transmission beam B. reflection path includes optical delay line composed of three pieces of reflectors, concave reflection lens and sample. With being delayed by optical delay line and being focused by concave reflection lens, beam A interact with the sample. Being reflected by reflector, beam B entering into photocathode X-rays diode hits photocathode so as to generate photoelectrons. Photoelectrons accelerated by anode voltage generate X ray, which is focused and dispersed by concave reflection grating to hit sample. The invention explores plasma process generated by beam A. the said plasma process is imaged, received by detector and displayed on computer.

Description

Technical field: [0001] The invention relates to X-ray imaging technology, especially a time-resolved photocathode X-ray diode imaging device, which has wide applications in the fields of material science, biochemistry and the like. Background technique: [0002] In the past five years, due to the adoption of new amplification techniques—chirped pulse amplification (i.e., CPA) and new broadband gain media, such as Ti:Sapphire and Cr:LiSAF, ultrashort pulse lasers on the order of terawatts have been achieved. A breakthrough has been made, and its peak power has reached 10 15 W, the average power is up to 10W, and the pulse width has been compressed to 4.3fs. Although the energy of the laser is not very high, its intensity can reach very high due to the extremely short pulse width and good focus. In addition, the repetition frequency of laser pulses has also reached 100kHZ, and it is estimated that it is expected to reach 10 in the near future. 3 On the order of kHZ, these a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/00G03B42/02
Inventor 高鸿奕陈建文李儒新徐至展
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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