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X ray interferometer with twin zone plates

An X-ray and zone plate technology, applied in the field of twin zone plate X-ray interferometers, can solve problems such as crystal growth and processing difficulties, and achieve the effect of simple structure and wide application prospects.

Inactive Publication Date: 2005-04-06
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

The biggest disadvantage of this kind of interferometer is that it needs three high-quality crystals, not only the direction of the crystal planes must be consistent, but also the three crystals must be parallel to each other, which undoubtedly brings difficulties to crystal growth and processing.
[0004] In April 2004, Gao Hongyi and others from the Shanghai Institute of Optics and Mechanics of the Chinese Academy of Sciences proposed a simple X-ray interferometer (see prior art: China Patent Office Patent Application No.: 200410017870.6), which has a very simple structure and can be obtained in biomedicine and other fields. Wide range of applications, but the two glass plates used in this interferometer require high precision machining

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  • X ray interferometer with twin zone plates

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Embodiment Construction

[0025] see first figure 1 , figure 1 It is an optical path structure diagram of an embodiment of the twin zone plate X-ray interferometer of the present invention. It can be seen from the figure that the structure of the twin zone plate X-ray interferometer of the present invention includes an X-ray source 1, which is located in the X-ray source 1 In the X-ray advancing direction, place the first zone plate 2 and the second zone plate 3 which are slightly deviated from the center and close to each other) After the focal point of the first zone plate 2 or the second zone plate 3, there is a A sample holder for measuring the sample 4, and then an X-ray detector 5 for detecting interference patterns is set.

[0026] Said X-ray source 1 is a synchrotron radiation source, and its output wavelength is limited to the X-ray region by a monochromator, which is about 1.5 Å.

[0027] Said first zone plate 2 and the second zone plate 3 are a commercially available X-ray zone plate with ...

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Abstract

The invention provides a twin wave zone plate X-ray interferometer, which comprises X-ray source and is characterized by the following: it is to locate first wave zone plate and second wave zone plate with their centers slight bias and close along the direction of X-ray moving direction; it is to locate a sample rack behind the focuses of the first and second wave zone plates; then to locate a X-ray detector to detect interferometer photograph.

Description

technical field [0001] The invention relates to an X-ray interferometer, in particular to a twin zone plate X-ray interferometer Background technique [0002] Since the wavelength of X-rays is much shorter than that of visible light, when it is used for precise detection, the theoretical resolution is 2 to 4 orders of magnitude higher than that of visible light. Therefore, high-resolution interferometry studies can be performed using X-ray interferometry. [0003] In 1965, U.Bonse and M.Hart of Cornell University in the United States developed the first X-ray interferometer. It was composed of three parallel single crystal silicon. Based on the principle of crystal diffraction, the first crystal was used as a Beam splitter, the second crystal combines the two beams of X-rays. Since the wavelength of X-rays is much shorter than that of visible light, the interference fringes they form are too dense to be directly observed with the naked eye, and the third crystal solves the ...

Claims

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Application Information

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IPC IPC(8): G01B9/021G01N23/00G03H1/04
Inventor 陈建文高鸿奕朱化凤干慧菁李儒新徐至展
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI