Test circuit of liquid crystal display and test method

Abstract

The testing circuit contains a base plate, where there are multiple pixel structures, multiple data lines and P pieces of shorting bars. Each pixel structure possesses n pieces of sub pixels connected corresponding multiple data lines. P pieces of shorting bars are connected to (pí‡m)+1, (pí‡m)+2, (pí‡m)+3 ...(pí‡m)+p pieces of data lines respectively; if n is odd number, then p=2í‡n; if n is even number, p=n, and m is zero or positive integer. Using the said testing circuit, the testing method groups P pieces of shorting bars based on n as radix. Inputting a test signal into each group of shorting bars carries out testing. Or, P pieces of shorting bars are arranged to two groups according to odd and even sequence; then, inputting a test signal into each group of shorting bars carries out testing. The invention raises efficiency of testing array section of liquid crystal display and section of crystal cell effectively.

Description

technical field [0001] The invention relates to a test circuit of a liquid crystal display, in particular to a test circuit of a liquid crystal display which is grouped by the number of sub-pixels. Background technique [0002] In the front-end process of making liquid crystal displays, epitaxial methods are generally used to form millions of thin film transistors on a substrate as the control unit of the sub-pixel of the pixel structure, wherein the substrate can be a glass substrate, a flexible type substrate or a silicon material substrate. If the quality of some thin-film transistors is not as good as expected during production, resulting in the inability to exhibit their switch control characteristics, defects such as bright and dark spots will occur, which will greatly reduce the quality of liquid crystal displays. How to efficiently deal with hundreds of Testing thousands of thin film transistors has become a very important issue in the production of liquid crystal d...

AI Technical Summary

Problems solved by technology

[0012] In this way, a liquid crystal display test circuit is developed. By setting short-circuit bars that are multiples of the number of sub-pixels, the liquid crystal display test circuit can effectively improve the test efficiency of the array section and the unit cell section when the liquid crystal display is produced to solve the problem. The problem of poor efficiency of the above-mentioned existing liquid crystal display test circuit when testing is actually the ardent expectation of liquid crystal display users and the inventor's memory, and the inventor has been engaged in the research and development of liquid crystal displays for many years and has many Practical experience, thinking and improved ideas, poor personal professional knowledge, and after many studies and design and special discussions, so far a liquid crystal display test circuit grouped by the number of sub-pixels is proposed as the above-mentioned problem-solution method and basis

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