Spectrophotometer for quickly measuring spectrum
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
- Publication Date
- 2006-03-29
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to a spectrum measuring instrument, in particular to a spectrophotometer for fast spectrum measurement. Background technique
[0002] As a spectral measuring instrument, a spectrophotometer can measure the spectral curves of a sample such as reflection, transmission, and absorption. It is a very important testing instrument in physics, chemistry, and life sciences.
[0003] The existing spectrophotometer structure diagram is as follows Figure 6 As shown, it mainly performs dispersion separation through the diffraction grating 12, and then uses the slit 3 to select light of a single wavelength as the measurement light. By rotating the angle of the grating 12, light with different wavelengths passes through the slit 3, so that continuous monochromatic light can be obtained. Since the detector 18 can only obtain data of a single wavelength every time the data is collected, the measurement speed of the existing spectrophotometer is ...