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Jewel internal-structure detection method and apparatus

A technology of internal structure and detection method, applied in the direction of measuring devices, testing jewelry, using optical devices, etc., can solve the problems of detection sample damage, failure to obtain accurate value of bead layer thickness, damage, etc., to improve detection signal-to-noise ratio and sensitivity Effect

Inactive Publication Date: 2006-08-09
王辉 +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] Among the above techniques, method 1 and method 2 belong to indirect measurement, and the accurate value of pearl layer thickness cannot be obtained
The third method is a destructive measurement, and the test sample must be destroyed.
[0004] It can be seen that there is no direct, non-contact measurement method that does not damage jewelry in the prior art

Method used

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  • Jewel internal-structure detection method and apparatus
  • Jewel internal-structure detection method and apparatus
  • Jewel internal-structure detection method and apparatus

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Embodiment Construction

[0021] The present invention will be further described below in conjunction with the accompanying drawings.

[0022] Each step in the detection method of jewelry internal structure among the present invention can be realized in the following manner,

[0023] Construct an optical Michelson interferometer: the light emitted by the light source is divided into two beams, the reference arm beam and the sample arm beam, through the beam splitter, wherein, the reference arm beam shoots to the mirror, and the sample arm beam shoots to the jewelry to be tested; when the reference arm mirror When scanning, the optical path is changed and modulated, and the backscattered light from different depths inside the jewelry and the reflected light from the reference arm mirror return to the beam splitter for superimposition and interference to generate an interference optical signal; the interference optical signal After being emitted from the beam splitter, it is received by the photodetector...

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Abstract

Present invention refers to jewelry internal structure detection method. It contains dividing the light emitted from low time coherence light source into first light beam and second light beam by spectroscope, first light beam and second light beam respectively radiation to a sample arm with fixed jewelry and reference arm generating optical path variation and reflexible light, adjusting optical path to make reference arm reflected light and sample arm reflected light generating interference signal, jewelry converting interference signal to correspondent electrical signal, transmitting electrical signal to signal processing analyzer, changing reference arm optical path to obtain jewelry layer depth directional one dimension reflected light strong signal and scanning tested jewelry to obtain two-dimension internal structure optical slicing image. Said invention utilizes optical interference principle to make poor jewelry inner back scattering light and rather strong reference light generating interference, through detection interference optical signal to detect jewelry inner structure, greatly raises detecting SNR and sensitivity.

Description

technical field [0001] The invention relates to a method and a device for detecting the internal structure of jewelry, in particular to a method for measuring the internal structure of non-contact jewelry and a corresponding device. Background technique [0002] The detection method for the internal structure of jewelry, especially the internal structure of opaque or translucent jewelry has always been an urgent problem in the field of jewelry detection. The methods for detecting the internal structure of jewelry in the prior art generally include the comparison method, the indirect detection method represented by the X-ray irradiation method, and the direct measurement method represented by the arbitration method. For example, in the detection of the thickness of the pearl layer, according to the national standard GB / T18781-2002 for the classification of cultured pearls, cultured pearls are divided into five grades: extra thick, thick, medium, thin, and extremely thin accor...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/45G01N21/84G01B11/06
CPCG01B9/02091G01N21/87G01N21/4795G01B9/02
Inventor 王辉何永红马辉
Owner 王辉
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