Interferometer of space heterodyne spectrograph tester

A space heterodyne and test device technology, which is applied in the directions of using multiple reflections to generate spectra, spectrum generation, and phase impact characteristic measurement, can solve problems such as difficult to achieve ultra-high resolution detection, and achieve low power consumption, small weight, and integrated high degree of effect

Inactive Publication Date: 2006-11-29
ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0007] Traditional spectral measurement methods are difficult to achieve ultra-high resolution detection, and s...

Method used

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  • Interferometer of space heterodyne spectrograph tester
  • Interferometer of space heterodyne spectrograph tester
  • Interferometer of space heterodyne spectrograph tester

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Embodiment Construction

[0019] see figure 1 , figure 2 .

[0020] The space heterodyne spectrometer test device is established by setting up a platform in the laboratory. The system structure is as follows: figure 1 As shown, it is composed of laser, laser beam expander, optical filter, collimating optical path, interferometer, computer and other parts. The target light source is modulated into a parallel light source through the collimated optical path system, and the interferometer performs spatial interference modulation on the light wave to form interference fringes with a certain spatial frequency. The spatial frequency of the interference fringes is a function of wavelength. The interference fringes are imaged in the linear array (or area array) detector through the imaging objective lens, and are recorded by the detector and saved in the computer, and the spectral curve can be restored through a specific algorithm.

[0021] The basic optical path of the interferometer of the spatial hetero...

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Abstract

The invention discloses a spatial heterodyne spectrometer tester interferometer, improved on the basis of Michelson interferometer, replacing two planar reflectors in the Michelson interferometer with two diffraction gratings; target light source is modulated through collimating light path system into parallel light source, and the interferometer makes spatial interference modulation on light wave to form interference stripes with a certain spatial frequency which is a function of wavelength, and the interference stripes are imaged through imaging object lens in linear array (or planar array) detector and the image is recorded by the detector and stored in computer, which can recover spectrum curve by specific algorithm.

Description

technical field [0001] The invention belongs to the field of optical and electronic measurement, in particular to an interferometer of a spatial heterodyne spectrometer test device. Background technique [0002] There are two main types of traditional high-resolution spectrometers: grating and interferometric. [0003] The dispersion principle of the grating spectrometer technology belongs to the space separation spectrum, that is, the spectrum is regularly arranged in the order of wavelength by using a dispersion device such as a grating, and spectral information of different wavelengths is obtained at different spatial positions. However, with the development of science and technology, higher requirements are put forward for spectral resolution technology and spectroscopic instruments. The traditional classic dispersive spectrometer with incident (exit) slit and dispersive system can no longer fully meet the requirements of higher resolution, fast, telemetry, higher sensi...

Claims

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Application Information

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IPC IPC(8): G01N21/45G01J3/26
Inventor 叶松洪津汪元均乔延利方黎方勇华杨伟锋荀毓龙王乐意
Owner ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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