Micro-total analysis system non-contact electric conductivity detecting method and apparatus
A micro-full analysis system and non-contact conductance technology, which is applied in the field of analysis technology and devices, can solve the problems of complex electrode processing, high requirements for surrounding environmental conditions, high-frequency signal voltage or high frequency, and achieve good safety and stability. , easy to use, simple process effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0024] Some examples are listed below.
[0025] 1. The chip whose cover or substrate is a thin diaphragm
[0026] (1) Chips of conventional glass substrate and thin glass membrane cover: on the side of the glass with a length of 61mm, a width of 30mm, and a thickness of 1.5mm, the microchannel is etched by a conventional method, and holes are punched at the end of the microchannel as a buffer pool. Get a conventional glass substrate, as shown in Figure 1A. The effective length of the separation channel (a-d-e) is 40mm, and the effective length of the sampling channel (b-c) is 14mm. Another thin glass with a length of 61 mm, a width of 30 mm, and a thickness of 30 μm was used as the membrane cover, as shown in Figure 1B. The cleaned glass substrate and membrane cover were stacked in a muffle furnace and heated to 550°C for 6 hours. Slowly lower the temperature and drop to 100°C after 15 hours. Repeat the process of heating up, keeping warm, and cooling down, and finally coo...
PUM
Property | Measurement | Unit |
---|---|---|
Thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com