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Membrane-based chip tooling

a technology of membrane-based chips and tooling, applied in the field of semiconductors, can solve the problems of increasing cost, compounding difficulty, and difficult to create electrically conductive vias, and achieve the effect of facilitating the formation of chip-to-chip electrical connections

Inactive Publication Date: 2006-12-14
CUFER ASSET LTD LLC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0006] One aspect involves a method for use with multiple chips, each respectively having a bonding surface including electrical contacts and a surface on a side opposite the bonding surface involves bringing a hardenable material located on a body into contact with the multiple chips, hardening the hardenable material so as to constrain at least a portion of each of the multiple chips, moving the multiple chips from a first location to a second location, applying a force to the body such that the hardened, hardenable material will uniformly transfer a vertical force, applied to the body, to the chips so as to bring, under pressure, a bonding surface of each individual chip into contact with a bonding surface of an element to which the individual chips will be bonded, at the second location, without causing damage to the individual chips or bonding surface.
[0008] Yet another aspect involves an apparatus for use with multiple chips, each respectively having a bonding surface including electrical contacts and a surface on a side opposite the bonding surface, the apparatus having a body, a material on a surface of the body that can be applied to the body in a viscous liquid or gel form and hardened into a hardened state, the material being in a hardened state and enveloping and restraining at least a portion of each of the multiple chips in such a manner so as to allow a uniform vertical force to be applied to the body from a side opposite the material of sufficient magnitude so as to bring the bonding surface on each of the at least two chips into contact with a respective corresponding bonding surface of an element to which the chips will be bonded without causing damage to the respective individual chips, the bonding surface, or the element.

Problems solved by technology

Making electrical contacts that extend all the way through an electronic chip (by creating electrically conductive vias) is difficult.
The difficulty is compounded when the vias are close enough for signal cross-talk to occur, or if the chip through which the via passes has a charge, because the conductor in the via can not be allowed act as a short, nor can it carry a charge different from the charge of the pertinent portion of the chip.
In addition, conventional processes, to the extent they exist, are unsuitable for use with formed integrated circuit (IC) chips (i.e. containing active semiconductor devices) and increase cost because those processes can damage the chips and thereby reduce the ultimate yield.
Indeed, there are numerous problems that are extant in the semiconductor art including: use of large, non-scaleable packaging; assembly costs don't scale like semiconductors; chip cost is proportional to area, and the highest performance processes are the most expensive, but only fraction of chip area actually requires high-performance processes; current processes are limited in voltage and other technologies; chip designers are limited to one process and one material for design; large, high power pad drivers are needed for chip-to-chip (through package) connections; even small changes or correction of trivial design errors require fabrication of one or more new masks for a whole new chip; making whole new chips requires millions of dollars in mask costs alone; individual chips are difficult and complicated to test and combinations of chips are even more difficult to test prior to complete packaging.

Method used

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Embodiment Construction

[0120] At the outset, it is to be understood that the term “wafer” as used herein is intended to interchangeably encompass all of the terms “chip”, “die” and “wafer” unless the specific statement is clearly and exclusively only referring to an entire wafer from which chips can be diced, for example, in references to an 8 inch or 12 inch wafer, chip or die “-to-wafer”, “wafer-to-wafer”, or “wafer scale” processing. If use of the term would, as a technical matter, make sense if replaced by the term “chip” or “die”, those terms are also intended. Moreover, a substantive reference to “wafer or chip” or “wafer or die” herein should be considered an inadvertent redundancy unless the above is satisfied.

[0121] In general, specific implementations of aspects described herein make it possible to form connections among two or more wafers containing fully-formed electronic, active optical or electro-optical devices in a simple, controllable fashion which also allows for a deep via depth, high ...

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Abstract

A method for use with multiple chips, each respectively having a bonding surface including electrical contacts and a surface on a side opposite the bonding surface involves bringing a hardenable material located on a body into contact with the multiple chips, hardening the hardenable material so as to constrain at least a portion of each of the multiple chips, moving the multiple chips from a first location to a second location, applying a force to the body such that the hardened, hardenable material will uniformly transfer a vertical force, applied to the body, to the chips so as to bring, under pressure, a bonding surface of each individual chip into contact with a bonding surface of an element to which the individual chips will be bonded, at the second location, without causing damage to the individual chips, element, or bonding surface.

Description

FIELD OF THE INVENTION [0001] The present invention relates to semiconductors and, more particularly, to electrical connections for such devices. BACKGROUND [0002] Making electrical contacts that extend all the way through an electronic chip (by creating electrically conductive vias) is difficult. Doing so with precision or controlled repeatability, let alone in volume is nearly impossible unless one or more of the following is the case: a) the vias are very shallow, i.e. significantly less than 100 microns in depth, b) the via width is large, or c) the vias are separated by large distances, i.e. many times the via width. The difficulty is compounded when the vias are close enough for signal cross-talk to occur, or if the chip through which the via passes has a charge, because the conductor in the via can not be allowed act as a short, nor can it carry a charge different from the charge of the pertinent portion of the chip. In addition, conventional processes, to the extent they exi...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): B32B37/00H01L21/00B44C1/165B32B38/10
CPCH01L21/6835H01L21/76898H01L23/427H01L23/48H01L23/481H01L23/49827H01L23/5389H01L23/552H01L23/66H01L24/02H01L24/11H01L24/13H01L24/16H01L24/24H01L24/75H01L24/81H01L25/0652H01L25/0657H01L25/18H01L25/50H01L2221/68345H01L2221/68363H01L2221/68368H01L2223/6616H01L2223/6622H01L2224/02372H01L2224/0401H01L2224/114H01L2224/1147H01L2224/116H01L2224/13012H01L2224/1308H01L2224/13082H01L2224/13083H01L2224/13084H01L2224/13111H01L2224/13144H01L2224/13147H01L2224/13155H01L2224/13166H01L2224/13184H01L2224/13609H01L2224/16146H01L2224/16237H01L2224/24226H01L2224/75H01L2224/75305H01L2224/81001H01L2224/81054H01L2224/81136H01L2224/81193H01L2224/81203H01L2224/81204H01L2224/81894H01L2224/83102H01L2224/92125H01L2225/06513H01L2225/06524H01L2225/06541H01L2225/06555H01L2225/06589H01L2225/06593H01L2225/06596H01L2924/01002H01L2924/01004H01L2924/01005H01L2924/01007H01L2924/01012H01L2924/01013H01L2924/01014H01L2924/01018H01L2924/01022H01L2924/01025H01L2924/01027H01L2924/01028H01L2924/01029H01L2924/0103H01L2924/01032H01L2924/01033H01L2924/01046H01L2924/01047H01L2924/01049H01L2924/0105H01L2924/01051H01L2924/01052H01L2924/01073H01L2924/01074H01L2924/01075H01L2924/01078H01L2924/01079H01L2924/01082H01L2924/014H01L2924/04953H01L2924/05042H01L2924/09701H01L2924/10329H01L2924/14H01L2924/19041H01L2924/19043H01L2924/30105H01L2924/3011H01L2924/3025H01S5/02272H01S5/0422H01S5/0425H01S5/183H01S5/18308H01S2301/176H01L2224/81825H01L2924/00013H01L2924/01006H01L2924/01023H01L2924/01024H01L2924/01042H01L2224/1358H01L2224/136H01L2224/81011H01L2225/06534H01L2225/06531H01L2924/10253H01L2224/11912H01L23/488H01L2924/00014H01L2224/45111H01L2224/13099H01L2924/00H01L2221/68327H01L2224/13021H01S5/04254H01S5/04257H01S5/0237H01S5/02345H01L21/44H01L21/28H01L21/4853
Inventor DUGAS, ROGERTREZZA, JOHN
Owner CUFER ASSET LTD LLC
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