Methods and systems for controlling a semiconductor fabrication process

Abstract

Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This claims the benefit of U.S. App. No. 60 / 746,163 filed on May 1, 2006 and U.S. App. No. 60 / 807,189 filed on Jul. 12, 2006. This application is a continuation-in-part of U.S. application Ser. No. 10 / 985,834, filed on Nov. 10, 2004, which claims the benefit of U.S. App. No. 60 / 518,823 filed on Nov. 10, 2003 and U.S. App. No. 60 / 607,649 filed on Sep. 7, 2004. This application is also a continuation-in-part of U.S. application Ser. No. 11 / 123,966 filed on May 6, 2005, and a continuation-in-part of U.S. application Ser. No. 11 / 302,563 filed on Dec. 13, 2005.[0002]Each of the foregoing commonly-owned applications is incorporated by reference herein in its entirety.BACKGROUND[0003]1. Field[0004]This invention relates to, inter alia, methods of utilizing a wafer-centric database to improve system throughput.[0005]2. Related Art[0006]The handling of workpieces such as wafers within a semiconductor manufacturing environment can present significa...

AI Technical Summary

Benefits of technology

The patent describes a system for controlling processes in a semiconductor manufacturing environment. The system includes a database, a real-time scheduler, and a graphical user interface. The system uses a state machine to schedule processing of workpieces, with the state machine including a plurality of states and transitions between them. The system also includes a neural network that receives data from the manufacturing system and calculates weights for each transition to select the best path. The technical effects of the patent include improved usability and computational efficiency for real-time control and monitoring of semiconductor manufacturing processes.

Problems solved by technology

The handling of workpieces such as wafers within a semiconductor manufacturing environment can present significant computing challenges.

Hardware such as process modules, handlers, valves, robots, and other equipment are commonly assembled from a variety of different manufacturers each of which may provide proprietary or pre-compiled software unsuitable for a newly conceived process.

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