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Semiconductor heat-dissipating substrate, and manufacturing method and assembly therefor

A semiconductor and substrate technology, applied in the field of semiconductor heat dissipation substrates, can solve the problems of not being able to be used as a semiconductor heat dissipation substrate and having a large thermal expansion coefficient, etc.

Inactive Publication Date: 2009-08-05
SUMITOMO ELECTRIC IND LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, although copper has a high thermal conductivity of about 393W / m.K, its thermal expansion coefficient is as large as 17×10 -6 / °C, cannot be used as a semiconductor heat sink substrate

Method used

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  • Semiconductor heat-dissipating substrate, and manufacturing method and assembly therefor
  • Semiconductor heat-dissipating substrate, and manufacturing method and assembly therefor
  • Semiconductor heat-dissipating substrate, and manufacturing method and assembly therefor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0096] Eight kinds of tungsten powders having the particle size distribution and iron group impurities shown in Table 1 were prepared. In the present invention, the particle size distribution in the powder is measured with a laser interferometer system for measuring particle size distribution. The tungsten powder was added to the stirring mixer, and the acrylic organic binder was added. The amount of the acrylic organic binder was 0.1 wt% relative to the tungsten powder, and then mixed with alcohol as a mixing medium for 1 hour to form a particle size of about 85μm secondary particles. The content of iron group metals in impurities contained in each of the obtained granular powders was determined; no admixture occurred during the mixing process, but the composition did not change from the first mixing.

[0097] Table I

[0098]

[0099] (Note: 5%, 50% and 95% in the column "Particle Size Distribution" in the table represent cumulative wt%)

[0100] The granulated powders...

Embodiment 2

[0108] To the tungsten powder with the serial number of 2-7 shown in the previous table 1, add iron powder and nickel powder with an average particle size of 1 μm as the iron group metal, and also add copper powder with an average particle size of 5 μm if necessary. The ratios are shown in Table III below. As in Example 1, these powders and the acrylic organic binder were added to a stirring mixer, and then mixed with alcohol as a mixing medium for 1 hour, thereby forming secondary particles having a particle diameter of about 85 μm. The content of iron group metals in impurities contained in each of the obtained granular powders was determined; no admixture occurred during the mixing process, but the composition did not change from the first mixing.

[0109] These granulated powders were then formed into flat sheets of 30 x 15 x 2 mm by press forming them in a powder forming press. The organic binders in these moldings were removed by heating at 400°C for 1 hour and then at ...

Embodiment 3

[0120] A semiconductor heat-dissipating substrate is fabricated that includes a central portion that carries the semiconductor element and an outer edge portion that is different in material therefrom. In this case, a molded article is produced by the following methods (1) to (6) in the press molding process.

[0121] (1) As shown in FIG. 1, an NC multi-axis press was used, in which the lower punches 2a and 2b were operated against the upper punch 1 at the center portion and the outer edge portion, respectively; as shown in (a), the The lower punch 2a is pushed up to a certain extent, and the W powder 3 shown as No. 5 in Table 1 above is loaded in the press; then, as shown in (b), the W powder 3 is extruded in the press, changing the The pressure of the central portion and the peripheral portion, thereby obtaining a molded product A as shown in (c), in which the density of the central portion and the peripheral portion are different, that is, the amount of voids is different. ...

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Abstract

A semiconductor heat dissipation substrate, which is made of copper-tungsten alloy, the alloy is a tungsten porous body in which copper is infiltrated in its pores, and the pore diameter of the tungsten porous body when the cumulative specific surface area is 95% is 0.3 μm or greater , when the specific surface area is 5%, the pore diameter of the tungsten porous body is 30μm or less, and the thermal conductivity can be 210W / m.K or greater by reducing the iron group metal content to less than 0.02wt%. Also, using a multiaxial press to vary the amount of copper infiltrated into the molded product to vary the amount of porosity in the central and peripheral portions provides low-cost provision for the central and peripheral parts to be made of different materials without the use of adhesives. The semiconductor heat dissipation substrate of the outer edge part.

Description

[0001] This application is a divisional application of Chinese Patent Application No. 02802972.0 (International Application Date: Aug. 23, 2002; Earliest Priority Date: Aug. 31, 2001) entitled Semiconductor Radiation Substrate, Production Method and Assembly therefor. technical field [0002] The invention relates to: a semiconductor heat dissipation substrate with excellent heat dissipation, the semiconductor heat dissipation substrate is suitable for high-frequency devices and semiconductor light-emitting devices whose semiconductor elements generate a large amount of heat; a production method of the semiconductor heat dissipation substrate; components and sub-fixtures and A semiconductor device using this substrate. Background technique [0003] Although semiconductors have made great strides as computing units and storage components in personal computers and other computers, due to the rapid spread of mobile communications and the development of large-capacity communicati...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/373H01L21/48
Inventor 高岛浩一山形伸一安部诱岳笹目彰
Owner SUMITOMO ELECTRIC IND LTD