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Low-pass filter for enhancing radiation resisting capability of charge pump

A filter and charge pump technology, applied in the direction of electrical components, automatic power control, etc., can solve problems such as abnormalities, achieve the effect of small structure and parameters, wide application range, and suppress output clock jitter

Inactive Publication Date: 2010-03-17
NAT UNIV OF DEFENSE TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There are multiple sensitive nodes in a traditional phase-locked loop (PLL), which may cause anomalies under the influence of single-event transients (SETs)

Method used

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  • Low-pass filter for enhancing radiation resisting capability of charge pump
  • Low-pass filter for enhancing radiation resisting capability of charge pump
  • Low-pass filter for enhancing radiation resisting capability of charge pump

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Embodiment Construction

[0015] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0016] figure 1 It is a structural block diagram of the radiation-hardened phase-locked loop involved in the present invention. The radiation hardened phase-locked loop includes two working modes: normal mode and compensation mode. When the phase-locked loop is working normally, due to the fixed input offset voltage of the operational amplifiers OP1 and OP2 in the filter, the output makes the compensation tube in the cut-off state, so the compensation circuit does not respond to the normal charge pump charge and discharge current, and the loop works in normal mode. When a single event transient (SET) occurs in the charge pump (CP), the high amplitude current pulse generated by the single event transient (SET) will be in the sense resistor R S A large voltage drop is generated on the circuit, which triggers the op amp to open the co...

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PUM

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Abstract

The invention discloses a filter aiming at the radiation hardening of a charge pump (CP), which comprises a basic filter and a circuit carrying out dynamic compensation on VC, wherein the basic filtercan be a filter in any charge pump type phase locked loops. The circuit carrying out the dynamic compensation on the VC comprises operation amplifiers OP1 and OP2, compensation pipes P1 and N1 and aninduction resistor RS. The RS is used for converting single electron transition (SET) current into the input voltage of the operation amplifiers, and the operation amplifier OP1 is used for detectingsingle electron transition (SET) in an NMOS pipe and controlling the opening of the compensation pipe P1 to carry out compensation. The operation amplifier OP2 is used for detecting the single electron transition (SET) in a PMOS pipe and controlling the opening of the compensation pipe N1 to carry out compensation. The invention has small expense and wide application range, effectively relieves the radiation influence of the charge pump in the phase locked loop, decreases the required time for recovering the locking of a loop circuit after radiation and has small influence on the parameter and the performance of the loop circuit of the original phase locked loop (PLL).

Description

technical field [0001] The invention mainly relates to the field of phase-locked loop design, in particular to a low-pass filter for improving the anti-radiation capability of a charge pump. Background technique [0002] PLLs are widely used in different fields, typical applications are clock generation, synchronization, frequency multiplication, jitter and skew reduction, frequency synthesis, etc. As the core part of the system, once the phase-locked loop is out of order, it will cause the whole system to fail to work. The single event transient (Single Event Transient, SET) phenomenon is a typical radiation effect, which is caused by high-energy particles bombarding the sensitive nodes of the circuit caused by galactic cosmic rays, solar particle events, natural decay of transuranium materials or explosions of nuclear weapons in the outer atmosphere. The particle energy deposition after bombardment leads to impact ionization, and the ionized charges are transported and co...

Claims

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Application Information

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IPC IPC(8): H03L7/093
Inventor 赵振宇李俊丰陈吉华马卓陈怒兴李少青张民选郭阳方粮蒋仁杰郭斌肖海鹏石大勇
Owner NAT UNIV OF DEFENSE TECH
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