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pHEMT (pseudomorphic High Electron Mobility Transistor) radio frequency switch ESD (Electrostatic Discharge) protection device and radio frequency front end module including same

A technology of electrostatic protection and radio frequency switch, applied in the field of radio frequency, can solve the problems of large insertion loss of radio frequency switch chip, low performance of radio frequency front-end of wireless communication, low reliability of radio frequency switch chip, etc., to reduce parasitic capacitance and reduce insertion loss. Effect

Active Publication Date: 2010-12-15
SPREADTRUM COMM (SHANGHAI) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The electrostatic protection (ESD) measure of the RF switch chip is usually to connect a diode on the pin of the RF switch chip as an electrostatic leakage path. However, if an ESD protection diode is added to the pin of the RF switch chip, such as Figure 2b As shown, since the diodes 404 and 405 in the GaAs pHEMT process are depletion diodes, there is a large parasitic capacitance at zero bias, resulting in a large insertion loss of the radio frequency switch chip, which seriously reduces the performance of the radio frequency front end of the wireless communication
Therefore, ESD protection is usually not implemented in the current RF switch chip, which makes the reliability of the RF switch chip low.

Method used

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  • pHEMT (pseudomorphic High Electron Mobility Transistor) radio frequency switch ESD (Electrostatic Discharge) protection device and radio frequency front end module including same
  • pHEMT (pseudomorphic High Electron Mobility Transistor) radio frequency switch ESD (Electrostatic Discharge) protection device and radio frequency front end module including same
  • pHEMT (pseudomorphic High Electron Mobility Transistor) radio frequency switch ESD (Electrostatic Discharge) protection device and radio frequency front end module including same

Examples

Experimental program
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Effect test

Embodiment 1

[0028] Such as image 3 Shown is an embodiment of the technical solution proposed by the present invention. The drain of the GaAs pHEMT device 513 is connected to the antenna 514; the source of the GaAs pHEMT device 513 is connected to the drain of the GaAspHEMT devices 501, 504, 507, and 510; the source of the GaAs pHEMT device 501, 504, 507, and 510 is connected to The transmitting channel or receiving channel in a communication terminal. GaAspHEMT device 502, GaAs pHEMT device 503, GaAs pHEMT device 505, GaAspHEMT device 506, GaAs pHEMT device 508, GaAs pHEMT device 509, GaAspHEMT device 511, 512 are all connected in the form of a diode, that is, their respective source and drain are connected. The cathode of the diode and the gate constitute the anode of the diode. The anode of the GaAs pHEMT device 502 is connected to the source of the GaAs pHEMT device 501; the cathode of the GaAs pHEMT device 502 is connected to the power supply voltage V CC The anode of the GaAs pHEMT...

Embodiment 2

[0034] Such as Figure 4 As shown, the drain of the GaAs pHEMT device 513 is connected to the antenna 514; the source of the GaAspHEMT device 513 is connected to the drains of the GaAs pHEMT devices 501, 504, 507, and 510; the source of the GaAs pHEMT devices 501, 504, 507, and 510 The pole is connected to the transmitting channel or the receiving channel in the communication terminal. GaAs pHEMT device 502, GaAs pHEMT device 503, GaAspHEMT device 505, GaAs pHEMT device 506, GaAs pHEMT device 508, GaAspHEMT device 509, GaAs pHEMT device 511, 512 are all connected in the form of a diode, that is, their respective source and drain are connected The cathode of the diode is formed, and the gate is the anode of the diode. The anode of the GaAspHEMT device 502 is connected to the source of the GaAs pHEMT device 501; the cathode of the GaAs pHEMT device 502 is connected to the power supply voltage V CC The anode of the GaAs pHEMT device 503 is connected to the ground; the cathode of ...

Embodiment 3

[0042] Such as Figure 5 As shown, the drain of the GaAs pHEMT device 513 is connected to the antenna 514; the source of the GaAspHEMT device 513 is connected to the drains of the GaAs pHEMT devices 501, 504, 507, and 510; the source of the GaAs pHEMT devices 501, 504, 507, and 510 The pole is connected to the transmitting channel or the receiving channel in the communication terminal. GaAs pHEMT device 502, GaAs pHEMT device 503, GaAspHEMT device 505, GaAs pHEMT device 506, GaAs pHEMT device 508, GaAspHEMT device 509, GaAs pHEMT device 511, 512 are all connected in the form of a diode, that is, their respective source and drain are connected The cathode of the diode is formed, and the gate is the anode of the diode. The anode of the GaAspHEMT device 502 is connected to the source of the GaAs pHEMT device 501; the cathode of the GaAs pHEMT device 502 is connected to the power supply voltage V CC The anode of the GaAs pHEMT device 503 is connected to the ground; the cathode of ...

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Abstract

The invention relates to a pHEMT (pseudomorphic High Electron Mobility Transistor) radio frequency switch ESD (Electrostatic Discharge) protection device and a radio frequency front end module including the same. The pHEMT radio frequency switch ESD protection device comprises third pHEMT switch devices (501, 504, 507, 510, 513) and a pHEMT ESD protection device, and the pHEMT ESD protection device is formed by connecting in series first pHEMT switch devices (502, 505, 508, 511) and second pHEMT switch devices (503, 506, 509, 512) in form of diodes. The pHEMT radio frequency switch ESD protection device is characterized in that the voltage of the third pHEMT switch devices (501, 504, 507, 510, 513) conducting a control signal is Vcc / 2+Vth, wherein the Vcc is a power source voltage, and the Vth is a threshold voltage between the third pHEMT switch devices (501, 504, 507, 510, 513) and a source electrode. The invention provides the ESD protection for a GaAspHEMT radio frequency switch and can reduce the parasitic capacitance for protecting diodes, thereby reducing the insertion loss of the radio frequency switch.

Description

Technical field [0001] The invention relates to the field of radio frequency, in particular to a pHEMT (Pseudo High Electron Mobility Transistor) radio frequency switch electrostatic protection device and a radio frequency front-end module containing the device. Background technique [0002] With the continuous development of modern wireless communication technology, there is a situation where multiple communication standards coexist, such as GSM, WCDMA, CDMA, TD-SCDMA and so on. In order to make the same wireless communication mobile phone terminal universal, it is required that the mobile phone terminal must support these different communication standards at the same time. Therefore, multiple radio frequency power amplifiers supporting different communication standards are required in the mobile phone terminal, and a radio frequency switch is used to switch the required radio frequency power amplifier to the transmission channel. At the same time, the radio frequency switch ca...

Claims

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Application Information

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IPC IPC(8): H02H9/04H04B1/40
Inventor 袁志鹏谢利刚
Owner SPREADTRUM COMM (SHANGHAI) CO LTD
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