Method and device for determining atmospheric turbulence parameter based on M<2> factor and light scintillation index
A technology of atmospheric turbulence and light flickering, applied in the direction of using optical devices, measurement devices, electrical components, etc., can solve the problems of complex measurement system, low scattering efficiency, and weak scattered light intensity.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0055] Laser device 1 used in the present embodiment is Nd: YAG laser device, and its wavelength is 1064nm; Optical transmitting antenna 2 is a Kepler telescope; Beamer 4 is a beam splitter with an operating wavelength of 1064nm, which is the same as the used Nd:YAG laser 1 wavelength; M 2 Factor Meter 5 for ModeMaster PC Type M 2 The factor measuring instrument; the light scintillation index measuring instrument 6 is a LAS / XLAS large aperture scintillation instrument; the distance between the optical transmitting antenna 2 and the optical receiving antenna 3 used is L=2km.
[0056] In this embodiment, as figure 1 The structure of the experimental setup is shown to realize the M-based 2 factor and light scintillation index to determine the method of atmospheric turbulence parameters. according to figure 1 The structure of the experimental device is equipped with each optical element, and its optical path process is described: the Nd:YAG laser 1 outputs a completely coheren...
Embodiment 2
[0070] In this embodiment, the laser 1 used in Embodiment 1 is replaced by a fiber laser, and its center wavelength is 1550nm; the optical transmitting antenna 2 is replaced by a Galileo telescope; the atmospheric turbulence is still uniformly distributed atmospheric turbulence; the optical receiving antenna 3 is replaced by a Newtonian telescope , the beam splitter 4 is replaced by a beam splitter whose working wavelength is 1550nm, M 2 Factor Meter 5 Replacement with M2-200 Series M 2 Factor measurement system, optical scintillation index measuring instrument 6 is replaced by BLS450 large-diameter scintillator, and data processor 7 is still the same as the data processor described in embodiment 1; then press figure 1 The structure of the experimental device is installed with each optical element, and the other operating experimental steps and calculation process are the same as in Example 1, and the M obtained by measurement can also be obtained 2 Atmospheric Turbulence Ref...
PUM
Property | Measurement | Unit |
---|---|---|
Wavelength | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com