Beam current shutter for simulation experiment of single-event-effect ground accelerator
A single event effect, simulation test technology, applied in radiation/particle processing, irradiation devices, nuclear engineering, etc., can solve the problems of SEE experimental chips and experimental personnel safety problems, deformation of shutter materials, and low shutter versatility, etc. Achieve the effect of simple structure, lower failure rate and lower production cost
Active Publication Date: 2011-10-19
CHINA INSTITUTE OF ATOMIC ENERGY
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Problems solved by technology
[0004] 1. The baffle is too thin, only about 100 μm. When the baffle is closed, some ions with a high range, such as protons, cannot be completely blocked, which may pose a threat to the safety of the SEE experimental chip and experimenters
[0005] 2. The block is easy to deform
After ions are incident inside the barrier, the material of the barrier will be deformed due to ion implantation, and when the ions accumulate to a certain amount, the barrier will be deformed and become unusable
[0006] 3. Monostable, poor reliability
But these shutters have little versatility, and most of them are "monostable" shutters
Method used
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[0026] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0027] figure 1 Shown is a schematic structural view of a beam shutter for a single event ground accelerator simulation test of the present invention, as can be seen from the figure that the beam shutter includes a motherboard 10, a beam shutter with a diameter of 20 mm located at the upper right of the motherboard. Through the hole 12, through the transitional mounting plate 11, the DC motor 4 fixed on the center line of the motherboard 10 is fixed on the shaft of the DC motor 4 through the small hole at the end of the connecting rod. Sheet 2, limit switches 3 and limit bolts 13 respectively fixed on both sides of the center line of the motherboard 10 for realizing the power-off after the shutter switching state is completed, and the mounting holes 14 and the mounting holes below the motherboard 10 for installing and fixing the shutt...
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The invention discloses a beam current shutter for a simulation experiment of a single-event-effect ground accelerator. The beam current shutter comprises a motherboard, a beam current passing hole and a separation blade, wherein the beam current passing hole is formed on the motherboard; the separation blade adapts to the size of the beam current passing hole; a direct-current motor is fixed at a position below the middle line of the motherboard through a transition installation plate; the separation blade is fixed on a shaft of the direct-current motor through a small hole at the tail end of a connecting rod; both sides of the middle line of the motherboard are provided with a limit switch and a limit bolt respectively; and one side of the motherboard is further provided with a polarityswitching circuit for changing the power supply polarity of the direct-current motor to realize state switching of the shutter. Due to the adoption of bistable state, the heat productivity of a coil is greatly reduced, the service life of the coil is prolonged, and the switch-on / off accuracy of beam current is increased. Copper is taken as a material, so that the problem that a thin separation blade of an optical shutter cannot block light ions is solved; and moreover, the beam current shutter has a simple structure and simple mechanical action, the production cost is reduced, the failure rate is lowered, and the reliability is enhanced.
Description
technical field [0001] The invention belongs to the technical field of accelerator irradiation, and in particular relates to a beam shutter used for a simulation test of a single-event effect ground accelerator. Background technique [0002] SEE (Single event effect) is an error effect caused by ion incident into the semiconductor device. In the single event effect ground simulation test, in order to accurately measure the fluence or protect the device in the event of latch-up, the accelerator beam line needs to be equipped with a beam shutter, so as to realize accurate and timely switching on and off of the beam. Currently, the HI-13 accelerator does not have a dedicated beam shutter on the beam duct, and the on-off of the beam is controlled by a Faraday cup. Due to the slow response time and inconvenient computer control, Faraday cages cannot meet the needs of single event effect experiments. [0003] There are currently no dedicated beam shutters available on the market...
Claims
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IPC IPC(8): G21K5/04G21K1/087
Inventor 史淑廷郭刚刘建成惠宁沈东军
Owner CHINA INSTITUTE OF ATOMIC ENERGY