Time-resolved Raman scattering characteristic spectrum analyzer
A Raman scattering and characteristic spectral line technology, which is applied in the field of time-resolved Raman scattering characteristic spectrometers, can solve the problems of low time resolution, unsatisfactory methods for eliminating background fluorescence interference, etc., and achieves high time resolution, reduced Noise such as thermal radiation and fluorescent background, and the effect of fast measurement speed
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[0013] The present invention takes the following technical solutions:
[0014] The time-resolved Raman scattering characteristic line instrument of the present invention is composed of a pulse laser, a Raman scattering optical path, a grating monochromator, a photodetector, a signal acquisition and processing circuit, and computer measurement and control software and hardware, and is characterized in that the photodetector consists of Composed of 1 unit or 2 or more multi-element strip SiPM; use TCSPC method to measure Raman scattering signal.
[0015] The multi-element strip SiPM is separated or monolithically integrated from 2 to 1024 strip SiPM units, wherein one SiPM unit (referred to as a reference detector unit) is used for positioning, aligning and measuring Rayleigh scattering signals, and the rest The SiPM unit (called a line detector unit) is used to align and measure the strongest Stokes peak of the substance to be detected. The distance between the reference detec...
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