Time-resolved Raman scattering characteristic spectrum analyzer
A Raman scattering and characteristic spectral line technology, which is applied in the field of time-resolved Raman scattering characteristic spectrometers, can solve the problems of low time resolution, unsatisfactory methods for eliminating background fluorescence interference, etc., and achieves high time resolution, reduced Noise such as thermal radiation and fluorescent background, and the effect of fast measurement speed
Inactive Publication Date: 2011-11-23
BEIJING NORMAL UNIVERSITY
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[0005] Aiming at the problems of low time resolution and unsatisfactory methods for eliminating background fluorescence interference in existing Raman technology, the present invention proposes a new time-resolved Raman scattering method and device—time-resolved Raman scattering characteristic line instrument
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[0013] The present invention takes the following technical solutions:
[0014] The time-resolved Raman scattering characteristic line instrument of the present invention is composed of a pulse laser, a Raman scattering optical path, a grating monochromator, a photodetector, a signal acquisition and processing circuit, and computer measurement and control software and hardware, and is characterized in that the photodetector consists of Composed of 1 unit or 2 or more multi-element strip SiPM; use TCSPC method to measure Raman scattering signal.
[0015] The multi-element strip SiPM is separated or monolithically integrated from 2 to 1024 strip SiPM units, wherein one SiPM unit (referred to as a reference detector unit) is used for positioning, aligning and measuring Rayleigh scattering signals, and the rest The SiPM unit (called a line detector unit) is used to align and measure the strongest Stokes peak of the substance to be detected. The distance between the reference detec...
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Abstract
The invention provides a novel time-resolved Raman scattering method and device, namely a time-resolved Raman scattering characteristic spectrum analyzer, aiming at the problem that the common Raman spectrometer has the defects of fluorescence background interference, low time resolution and lower trace analysis detection speed. In the invention, a multielement strip silicon photo-multiplier detector (SiPM) with high gain and high response speed is used as a photodetector, and a Raman signal is measured by combining a time-correlated single photon counting (TCSPC) method with the photodetector, therefore, the time-resolved Raman scattering characteristic spectrum analyzer has time resolution of a picosecond order of magnitude and single photon counting detectivity. The time-resolved Raman scattering characteristic spectrum analyzer not only can be independently used as a Raman scattering characteristic spectrum analyzer for rapidly judging whether a sample contains a plurality of compositions synchronously by using the characteristic spectrum of the Raman scattering, or for accurately identifying the compositions through scanning the complete Raman spectrum of the detection sample by a grating monochromator, but also can be used as a function expansion module based on the traditional Raman spectrometer for enhancing the time resolution, reducing the fluorescence background interference, and increasing the signal to noise ratio and the detection speed.
Description
1. Technical field [0001] The present invention relates to a principle and method for rapid detection of trace substances using Raman scattering characteristic peaks, especially the use of silicon photomultiplier detectors (SiPM, also known as multi-unit photon counters MPPC) and time-resolved single photon counting (TCSPC ) method of time-resolved Raman scattering characteristic spectrometer. It belongs to the technical field of category G01. 2. Background technology [0002] Raman scattering is a kind of inelastic scattering that occurs when photons interact with molecules, which reflects the information of molecular structure. Different types of molecules have different Raman scattering spectra, so Raman spectra have "fingerprint" characteristics (that is, contain characteristic spectrum Line structure) can be used as a means to detect the composition and structure of substances (see Ewen Smith, Geoffrey Dent, Modern Raman Spectroscopy: A Practical Approch, ISBN 0-471-49...
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IPC IPC(8): G01N21/27
Inventor 韩德俊张丽颖张春玲
Owner BEIJING NORMAL UNIVERSITY
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