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Time domain analysis method for transient response of lossy nonuniform multi-conductor transmission lines

A multi-conductor transmission line, transient response technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems affecting the accuracy of transient response analysis, divergence of analysis results, and inability to analyze transmission lines.

Inactive Publication Date: 2012-04-11
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the calculation results oscillate due to the use of the central difference method. This oscillation problem may affect the accuracy of the transient response analysis, resulting in wrong transient analysis results. In severe cases, the analysis results may even diverge, and the transient response of the transmission line cannot be analyzed. to analyze

Method used

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  • Time domain analysis method for transient response of lossy nonuniform multi-conductor transmission lines
  • Time domain analysis method for transient response of lossy nonuniform multi-conductor transmission lines
  • Time domain analysis method for transient response of lossy nonuniform multi-conductor transmission lines

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Embodiment 1

[0059] The software MATLAB is used for simulation, and the simulated excitation voltage source is added to the attack line in the lossy non-uniform multi-conductor transmission line. For the signal waveform of the excitation source, see Figure 4 .

[0060] The total number of lossy non-uniform multi-conductor transmission lines analyzed must be greater than or equal to 3, of which at least one is an infinite flat metal transmission line as a reference conductor, and there are two transmission lines that are coupled and interfered as signal lines. See image 3 , image 3 It is a simulation model of a transmission line with unequal length and non-uniform lossy conductors terminated with resistive loads. Conductor 1 and Conductor 2 are two transmission lines that are coupled and interfered with each other as signal lines, but image 3 An infinite metal flat plate transmission line as a reference conductor is not shown. The transmission line that interferes with other transmission lin...

Embodiment 2

[0076] The transient response time-domain analysis method of lossy non-uniform multi-conductor transmission line is the same as that in Example 1. image 3 The simulation model shown is a 3-conductor lossy non-uniform transmission line terminated with a resistive load. In the figure, both conductor 1 and conductor 2 are signal lines, conductor 3 is not shown in the figure, and conductor 3 is an infinite metal flat plate as a reference conductor. L1 and L2 are the lengths of conductor 1 and conductor 2, respectively. Endpoints A, B, C, and D represent the ends of conductors 1 and 2, respectively. The distribution parameters of the transmission line are:

[0077] L = L ( z ) Lm ( z ) Lm ( z ) L ( z ) C = C ( z ) Cm ( z ) Cm ( z ) C ( z ) R = R ( z ) 0 0 R ( z ) G = G ( z ) 0 0 ...

Embodiment 3

[0106] The transient response time-domain analysis method of lossy non-uniform multi-conductor transmission line is the same as that of embodiment 1-2, and the simulation model and conditions are also the same as that of embodiment 1-2. image 3 The lengths of conductor 1 and conductor 2 in the simulation model are 0.1m and 0.2m, respectively. The voltage transient response waveforms of the transmission line endpoints A and B obtained by using the FDTD method are as follows: Picture 9 As shown, the voltage transient response waveforms of the transmission line endpoints C and D are as follows Picture 10 Shown. Under the same simulation conditions, the voltage transient response waveforms of the transmission line endpoints A and B obtained by using the time domain analysis method proposed by the present invention are as follows: Picture 11 As shown, the voltage transient response waveforms of the transmission line endpoints C and D are as follows Picture 12 Shown. Observed Pic...

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Abstract

The invention provides a time domain analysis method for a transient response of lossy nonuinform multi-conductor transmission lines and aims to solve the problem that the coupling among the lossy nonuniform multi-conductor transmission lines interferes with the computation in the field of integrity of electronic circuit signals. The method comprises the following steps of: performing differential dispersion on space differential operators in an electric wave equation; and integrating time differential operators in the electrical wave equation by a trapezoidal integration method to ensure that the oscillation, which is caused by a central difference method, of a computed result can be eliminated effectively, voltage and current transient response waveforms of any point on the transmissionlines can be acquired; and the transient analysis of the transmission lines in a longer time period is effective, the waveforms can be analyzed in a longer duration without large errors, and the coupled transmission lines are not needed to be decoupled when a model of the transmission lines is built. By the method, the computational load is reduced, and the simulation efficiency is improved. The method can be used for analyzing the transient response of the lossy nonuinform multi-conductor transmission lines.

Description

Technical field [0001] The invention belongs to the field of electronic circuit signal integrity, and relates to the electromagnetic compatibility of high-speed circuits, especially the coupling interference between transmission lines. Specifically, it is a lossy non-uniform multi-conductor transmission line transient response time domain analysis method, which can be used to analyze lossy The transient response of a non-uniform multi-conductor transmission line provides theoretical guidance for reducing the interconnection effect in the circuit, thereby ensuring the signal integrity of the circuit. Background technique [0002] With the reduction of the feature size of VLSI, the shortening of the rise time, the expansion of the integration scale and the increase of the clock frequency, the interconnection effects such as delay, reflection, distortion and crosstalk caused by the interconnection line may affect the performance index of the circuit , Make the system unstable, and e...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 叶强史凌峰曹成美来新泉贾军
Owner XIDIAN UNIV
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