Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Heat load test method and device for split type dewar at different refrigeration temperatures

A test device and separate technology, which is applied in the field of engineering Dewar thermal load testing, achieves the effects of simple device and implementation method, low cost and strong versatility

Active Publication Date: 2012-06-20
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
View PDF3 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of this patent is to provide a thermal load test method and device at different refrigeration temperatures of a separate Dewar, which solves the thermal load test of a large thermal load Dewar component and the test of the coupling effect of the Dewar and the refrigerator

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Heat load test method and device for split type dewar at different refrigeration temperatures
  • Heat load test method and device for split type dewar at different refrigeration temperatures
  • Heat load test method and device for split type dewar at different refrigeration temperatures

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0072] Below in conjunction with accompanying drawing, the specific embodiment of this patent is described in further detail:

[0073] Embodiment is the thermal load test of a certain large thermal load (according to estimation thermal load value is greater than 1.5 watts) infrared detector focal plane Dewar assembly, as attached figure 1 As shown, its main implementation method is as follows:

[0074] 1. The preparation method and assembly sequence of each component of the highly compatible and multifunctional testing Dewar in this patent are as follows:

[0075] a) The cavity cap 2-1 is made of stainless steel 304L, and the exhaust pipe 2-18 is an oxygen-free copper tube with an outer diameter of 6mm and an inner diameter of 4mm and a length of 60mm. The exhaust pipe 2-18 is brazed to the cavity cap 2- with a brazing furnace. At the opening 2-101 of the exhaust pipe of 1, use a leak detector to check the weld, and the leak rate reaches 1.0×10 -11 torr·l / s level, meet the r...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a heat load test method and device for split type dewar at different refrigeration temperatures. The heat load test device for the split type dewar at different refrigeration temperatures comprises a to-be-detected split type engineering dewar, a high-compatible multifunctional test dewar, an engineering dewar adapted refrigerator, a refrigerator control box, a power meter, a refrigerator working power supply, an air exhauster, a heating power supply, a heating voltmeter and a heating galvanometer. According to the heat load test method and device for the split type dewar at different refrigeration temperatures, disclosed by the invention, a special structure is introduced in the aspect of the high-compatible multifunctional test dewar, so that the static heat loadprecise detection for the split type engineering dewar is realized through an assembly replacement method and a heat equalization method. The device and implementation method thereof, disclosed by the invention, have the advantages of simpleness, high test precision, strong generality and low cost. The method and device disclosed by the invention are same suitable for testing a refrigeration capacity of an engineering refrigerator at different refrigeration temperatures. The method and device disclosed by the invention are also suitable for testing the temperature gradient of elastic cold chains or carbon paper or other coupling mediums on the cold fingers of the engineering refrigerator at different refrigeration temperatures and under different transfer refrigeration capacities.

Description

technical field [0001] This patent relates to engineering Dewar thermal load testing technology, specifically refers to a method and device for thermal load testing of engineering Dewar of separate infrared detector components under different cooling temperatures. Background technique [0002] Infrared detector Dewar components are widely used in aerospace infrared field. With the expansion of wavelength to long wavelength and the improvement of detection sensitivity, infrared focal detectors must work at deep and low temperatures. Due to the advantages of mechanical refrigeration, such as compact structure, small size, light weight, large cooling capacity, short cooling time, and large controllable range of cooling temperature, most of these detectors currently use mechanical cooling in space applications. This also makes it mostly use Dewar packaging to form an infrared detector Dewar assembly during its application. Heat load is an important technical index of Dewar com...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01J5/00G01J5/02
Inventor 夏王王小坤孙闻
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com