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Non-volatile memory with P+ single polycrystalline architecture and preparation method for non-volatile memory

A non-volatile, memory technology, applied in semiconductor/solid-state device manufacturing, electric solid-state devices, semiconductor devices, etc., can solve problems affecting reliability, easy loss of written data, and complexity, so as to improve the safety and reliability of use , Reduce processing costs, improve adaptability

Active Publication Date: 2012-07-04
SUZHOU FENGCHI MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The combination of non-volatile memory (NVM) process and traditional logic process will make the process a more complex and expensive combination; since the typical use of non-volatile memory for SoC applications is in relation to the whole The chip size is small, so this practice is not advisable
At the same time, due to the working principle of the existing non-volatile memory, the written data is easily lost, which affects the reliability of use

Method used

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  • Non-volatile memory with P+ single polycrystalline architecture and preparation method for non-volatile memory
  • Non-volatile memory with P+ single polycrystalline architecture and preparation method for non-volatile memory
  • Non-volatile memory with P+ single polycrystalline architecture and preparation method for non-volatile memory

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Experimental program
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Embodiment 1

[0068] like figure 1 and Figure 13 Shown: In order to make the non-volatile memory compatible with the CMOS logic process, and to enable the non-volatile memory to be stored for a longer time, the non-volatile memory includes a P conductive type substrate 201, a P conductive type substrate 201 The material is silicon. At least one memory cell 200 is disposed on the upper part of the P conductive type substrate 201 . The memory cell 200 includes a PMOS access transistor 210 , a control capacitor 220 and a programming capacitor 230 , and a gate electrode is deposited on the surface of the P conductive type substrate 201 . The dielectric layer 215 covers the surface corresponding to the memory cell 200 . The PMOS access transistor 210 , the control capacitor 220 and the programming capacitor 230 are isolated from each other by the domain dielectric region 214 in the P conductive type substrate 201 . A floating gate electrode 216 is deposited on the gate dielectric layer 215, t...

Embodiment 2

[0094] like figure 2 and Figure 23 As shown: in this embodiment, the semiconductor substrate is an N conductive type substrate 239. When the N conductive type substrate 239 is used, the second N type region 203, that is, the second P type region 205 and the second N type region 203, do not need to be formed in the N conductive type substrate 239. The three P-type regions 231 are in direct contact with the N-type conductive type substrate 239 , and at the same time, the first N-type region 202 and the third N-type region 204 are also in direct contact with the N-type conductive type substrate 239 . The rest of the structure after using the N conductive type substrate 239 is the same as that of the first embodiment.

[0095] like Figure 14 ~ Figure 23 Shown: the non-volatile memory of the above structure can be realized by the following process steps, specifically:

[0096] a. Provide an N conductive type substrate 239, the N conductive type substrate 239 includes a first ...

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Abstract

The invention relates to a non-volatile memory with a P+ single polycrystalline architecture and a preparation method for the non-volatile memory. The non-volatile memory comprises a semiconductor substrate and memory cells, wherein each memory cell comprises a P-channel metal oxide semiconductor (PMOS) access transistor, a control capacitor and a programming capacitor; a gate medium layer is deposited on the surface of the semiconductor substrate; a floating gate electrode is arranged on the gate medium layer, and covers and penetrates through the corresponding gate medium layer above the PMOS access transistor, the control capacitor and the programming capacitor; side protection layers are deposited on two sides of the floating gate electrode; the PMOS access transistor comprises a first N-type area, a P-type source area and a P-type drain area; the control capacitor comprises a second P-type area, a first P-type doping area and a second P-type doping area; and the programming capacitor comprises a third P-type area, a fifth P-type doping area and a sixth P-type doping area. The non-volatile memory is compact in structure and compatible with a complementary metal oxide semiconductor (CMOS) process, the cost of a chip is reduced, and the safety and reliability of the memory are improved.

Description

technical field [0001] The invention relates to a non-volatile memory and a preparation method thereof, in particular to a non-volatile memory with a P+ single polycrystalline structure and a preparation method thereof, belonging to the technical field of integrated circuits. Background technique [0002] For system-on-chip (SoC) applications, it is the integration of many functional blocks into one integrated circuit. The most commonly used SoCs include a microprocessor or microcontroller, static random access memory (SRAM) modules, non-volatile memory, and various special-purpose logic blocks. However, the processes in traditional non-volatile memory, which typically use stacked gate or split gate memory cells, are not compatible with traditional logic processes. [0003] The non-volatile memory (NVM) process is different from the traditional logic process. The combination of non-volatile memory (NVM) technology and traditional logic technology will make the process a mo...

Claims

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Application Information

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IPC IPC(8): H01L29/94H01L29/423H01L27/115H01L21/8247
Inventor 雷兵方英娇陈号年
Owner SUZHOU FENGCHI MICROELECTRONICS