Double poly-crystal plane strain BiCMOS integrated device based on SOI (Silicon On Insulator) substrate and preparation method
A plane strain, integrated device technology, applied in semiconductor/solid-state device manufacturing, electrical solid-state devices, semiconductor devices, etc., can solve the problems of difficult preparation of large-diameter single crystals, poor heat dissipation performance, and low mechanical strength
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[0111] Embodiment 1: A self-aligned process is used to prepare a 22nm dual polycrystalline plane strain BiCMOS integrated device and circuit based on an SOI substrate with a conductive channel. The specific steps are as follows:
[0112] Step 1, epitaxial growth.
[0113] (1a) Select an SOI substrate, the lower support material of the substrate is Si, and the middle layer is SiO 2 , The thickness is 150nm, the upper layer material is doping concentration is 1×10 16 cm -3 N-type Si with a thickness of 100nm;
[0114] (1b) Using chemical vapor deposition (CVD) method, at 600℃, grow a layer of N-type epitaxial Si with a thickness of 50nm on the upper Si material as a collector area, the doping concentration of this layer is 1× 10 16 cm -3 .
[0115] Step 2. Preparation of isolation area.
[0116] (2a) Using chemical vapor deposition (CVD), at 600℃, deposit a layer of SiO with a thickness of 300nm on the surface of the epitaxial Si layer 2 Floor;
[0117] (2b) In the lithographic isolation ...
Example Embodiment
[0169] Embodiment 2: A self-aligned process is used to prepare a dual polycrystalline plane strain BiCMOS integrated device and circuit based on a SOI substrate with a conductive channel of 30 nm. The specific steps are as follows:
[0170] Step 1, epitaxial growth.
[0171] (1a) Select an SOI substrate, the lower support material of the substrate is Si, and the middle layer is SiO 2 , The thickness is 300nm, the upper material is doping concentration is 5×10 16 cm -3 N-type Si with a thickness of 120nm;
[0172] (1b) Using the chemical vapor deposition (CVD) method, at 700℃, grow a layer of N-type epitaxial Si with a thickness of 80nm on the upper Si material as a collector area, the doping concentration of this layer is 5× 10 16 cm -3 .
[0173] Step 2. Preparation of isolation area.
[0174] (2a) Using chemical vapor deposition (CVD) method, at 700℃, deposit a layer of SiO with a thickness of 400nm on the surface of the epitaxial Si layer 2 Floor;
[0175] (2b) In the lithographic is...
Example Embodiment
[0227] Embodiment 3: Using a self-aligned process to prepare a dual polycrystalline plane strain BiCMOS integrated device and circuit based on an SOI substrate with a 45nm conductive channel, the specific steps are as follows:
[0228] Step 1, epitaxial growth.
[0229] (1a) Select an SOI substrate, the lower support material of the substrate is Si, and the middle layer is SiO 2 , The thickness is 400nm, the upper layer material is doping concentration is 1×10 17 cm -3 N-type Si with a thickness of 150nm;
[0230] (1b) Using chemical vapor deposition (CVD) method, at 750℃, grow a layer of N-type epitaxial Si layer with a thickness of 100nm on the upper Si material as a collector area, the doping concentration of this layer is 1× 10 17 cm -3 .
[0231] Step 2. The realization method of isolation area preparation is:
[0232] (2a) Using chemical vapor deposition (CVD), at 800℃, deposit a layer of SiO with a thickness of 500nm on the surface of the epitaxial Si layer 2 Floor;
[0233] (2b)...
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