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189results about How to "Reduce parasitic parameters" patented technology

3D (three-dimensional) NAND memory and manufacturing method thereof

The invention discloses a 3D (three-dimensional) NAND memory and a manufacturing method of the 3D NAND memory. The 3D NAND memory comprises multiple layers of storage arrays and multiple layers of control grid circuits, wherein each layer of the control grid circuit is electrically connected to the same layer of the storage array, so that selection of each layer of the storage array is realized; each layer of the control grid circuit is obtained by cascading a same number of transistors; grids of all the transistors of the control grid circuits are electrically connected to control wires; the number of the control wires is as the same as that of the transistors comprised in each layer of the control grid circuit; the grids of different transistors positioned on the same layer of the control grid circuit are electrically connected to different control wires. According to the 3D NAND memory, a small number of input control wires SSL select a large number of control grid layers through the control grid circuits, so that the area and the volume of the whole memory cannot be enlarged due to the increase of the number of the required layers of control grids when the storage capacity of the memory is improved due to the increase of the number of storage unit layers.
Owner:SEMICON MFG INT (SHANGHAI) CORP

MEMS (Micro-Electromechanical System) sensor encapsulation structure and encapsulation method thereof

The invention relates to an MEMS sensor encapsulation structure and an encapsulation method thereof, which are used for encapsulating an MEMS sensor. The MEMS sensor encapsulation structure is characterized by comprising a ceramic base, a side wall and a top cap, wherein a plurality of metal bonding pads are respectively arranged on a top layer and a bottom layer of the ceramic base; the metal bonding pads on the top layer of the ceramic base are connected with leads of the MEMS sensor; the MEMS sensor is arranged on the ceramic base; the metal bonding pads on the bottom layer of the ceramic base are connected with an external circuit; the ceramic base adopts one-layer or multi-layer perpendicularly interconnected structure; the side wall and the top cap are both made of kovar alloy. According to the invention, the ceramic base of which coefficient of thermal expansion is approximate to that of the MEMS sensor material is selected as the encapsulation material, in order to reduce influence of the base expansion stress to the MEMS sensor; meanwhile, the ceramic base can be utilized to realize one-layer perpendicular interconnection or multi-layer perpendicular interconnection; the system-level integration between the MEMS sensor and the peripheral circuit can be realized within a small area; high-density system-level encapsulation can be realized; the encapsulation flexibility and the expansibility of the MEMS sensor can be realized.
Owner:INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI

Testing method and device for dynamic switching characteristics of IGBT (Insulated Gate Bipolar Transistor) by utilizing double-pulse technology

The invention relates to a testing method and device for dynamic switching characteristics of an IGBT (Insulated Gate Bipolar Transistor) by utilizing a double-pulse technology. A double-pulse signal is sent out through utilizing a signal chip microcomputer; a tested IGBT reaches rated working current by a first pulse and a second pulse is used for testing dynamic characteristics of the IGBT; and dynamic voltage and current parameters of the IGBT in a switching-on / off process are tested by utilizing an oscilloscope and a difference isolating probe. The double-pulse signal passes through an IGBT driving board to control the IGBT to be switched on / off in extremely short time; an experiment circuit and a testing circuit are isolated through an isolation transformer so that mutual interference of the signals is avoided; current of a main circuit and voltage at two ends of the IGBT, and voltage at an output end of a driving circuit are measured by utilizing the isolation transformer, the oscilloscope and the difference isolating probe; an oscillogram is recorded by the oscilloscope; and dynamic switching characteristic parameter sizes of the IGBT are calculated according to ascending and descending time, delaying time and on-off energy. Parasitic parameters in the circuits are reduced and a testing result is accurate.
Owner:TIANJIN UNIV

Manufacturing method of three-dimensional bonding stack interconnect integration for radio-frequency microsystem device

The invention provides a manufacturing method of a three-dimensional bonding stack interconnect integration for a radio-frequency microsystem device. The method comprises the steps as follows: high-resistivity silicon is taken as a substrate or an adapter plate; multi-layer dielectric-metal alternate wiring is completed for radio-frequency signal transmission and control on the substrate or the adapter plate; heterogeneous compound chips achieve heterogeneous integration through chip to wafer bonding, all chips are connected with metal bumps on the silicon substrate or the adapter plate through a bottom bonding pad to achieve signal transmission among different layers, and three-layer structure stacking and chip protection are achieved through bonding of wafers with silicon cavities and the wafer of the silicon substrate or the adapter plate; and leading-out of signals of a whole device is achieved by adopting a through-silicon via technology. The method has the advantages that the heterogeneous chips are integrated together through three-layer stacking, so that the original function of the device is greatly improved, leading-out of the signals from bonding interfaces is achieved by adopting the through-silicon via technology, a closed and compact chip structure is formed, three-dimensional heterogeneous integration of a radio-frequency device is really achieved, the technology is simplified, packaging is low in cost and the yield is high.
Owner:NO 55 INST CHINA ELECTRONIC SCI & TECHNOLOGYGROUP CO LTD

Field-effect transistor and manufacturing method thereof

The embodiment of the invention provides a field-effect transistor and a manufacturing method thereof and relates to the technical field of semiconductors. Parasitic parameters of the field-effect transistor can be reduced to improve the reliability of the field-effect transistor. The method comprises the steps as follows: a support structure with superlattice characteristics is formed on a semiconductor substrate; the support structure comprises first semiconductor material layers and second semiconductor material layers, which are alternately arranged; isolating layers are arranged at two sides of the support structure; a false gate structure covering the support structure is formed along the juncture of the isolating layers and the support structure; the length of the false gate structure in a gate length direction is smaller than those of the first semiconductor material layers in the gate length direction; areas except for sacrificial layers in the first semiconductor material layers are removed along the gate length direction to form insulating grooves; the dielectric constants of mediums filled into the insulating grooves are smaller than those of the first semiconductor material layers; and a source and a drain are formed in preset source region and drain region along the gate length direction and the source and the drain are isolated from the sacrificial layers through the insulating grooves.
Owner:HUAWEI TECH CO LTD

Encapsulated micro-wave voltage-controlled oscillator test device

The invention discloses an encapsulated micro-wave voltage-controlled oscillator test device. The device comprises a test clamp used for installing and fixing a voltage-controlled oscillator, a conductive rubber and a test adaption circuit board. The test adaption circuit board is installed on a metal base plate and is connected to monitoring equipment through a cable. The conductive rubber is pasted on a central section of an upper end surface of the test adaption circuit board. The test clamp is placed on the test adaption circuit board and is fixedly connected to the metal base plate. In the invention, an encapsulated micro-wave voltage-controlled oscillator is placed in the test clamp; and a pin of the oscillator is connected to the test adaption circuit board through the conductive rubber so that contact between a chip pin and the test adaption circuit board can be avoided, a parasitic parameter is reduced and normal transmission of microwave signals is guaranteed. Besides, because of elasticity of the conductive rubber, damages generated through carrying out hard pressing on the chip can be avoided; test reliability and test efficiency of the encapsulated micro-wave voltage-controlled oscillator are increased; and the device possesses characteristics that the structure is simple and assembling and disassembling are convenient.
Owner:GUIZHOU AEROSPACE INST OF MEASURING & TESTING TECH

3D integrated framework of ultrahigh frequency power converter

The invention provides a 3D integrated framework of an ultrahigh frequency power converter. The 3D integrated framework comprises a PCB circuit layer and a winding unit erected on the PCB circuit layer. The winding unit is connected with the PCB circuit layer through a wire. The winding unit comprises winding layers formed on a first insulating layer and a first soft magnetic thin film layer formed on a second insulating layer. The first soft magnetic thin film layer is arranged below the winding layers in a laminated mode to be used for achieving magnetic shielding between the winding layers and the PCB circuit layer. Compared with the prior art, by the adoption of 3D integration, the size of the converter is reduced, and the power density is increased; soft magnetic materials are adopted to form the magnetic shielding layer, magnetic field interference between windings and the PCB circuit layer and between the windings and external metal is solved, the Q value of the windings is increased, the alternating current resistance and high-frequency loss of an inductor and a transformer are reduced, and the working efficiency of the converter is improved; a plane magnetic element is further adopted, and the miniaturization and flattening of products are guaranteed; temperature rising of the magnetic element is reduced greatly, and the working environment of a semiconductor device is improved.
Owner:MORNSUN GUANGZHOU SCI & TECH +1

Germanium-silicon photoelectric detector with high bandwidth and high responsivity

The invention discloses a germanium-silicon photoelectric detector with high bandwidth and high responsivity, and relates to the technical field of photoelectric detection. The germanium-silicon photoelectric detector comprises a silicon waveguide, a silicon substrate, a lightly doped silicon region, a heavily doped silicon region, a germanium absorption region, an epitaxial silicon region, an epitaxial silicon doped region, a first electrode and a second electrode. The silicon waveguide is used for transmitting incident light; the silicon substrate is used for receiving the incident light propagated by the silicon waveguide; the lightly doped silicon region is arranged in the silicon substrate; the heavily doped silicon region is arranged in the lightly doped silicon region; the germaniumabsorption region is arranged on the lightly doped silicon region, the germanium absorption region comprises a first part far away from the silicon waveguide, and the projection surface of the firstpart on the lightly doped silicon region is arc-shaped; the epitaxial silicon region surrounds and covers the germanium absorption region; the epitaxial silicon doped region covers the top of the germanium absorption region; the first electrode is arranged on the heavily doped silicon region, and the shape of the first electrode is matched with that of the heavily doped silicon region; the secondelectrode is arranged on the epitaxial silicon doped region. The germanium-silicon photoelectric detector has high responsivity and relatively high bandwidth.
Owner:WUHAN POST & TELECOMM RES INST CO LTD +1

Pulse laser emission circuit

The invention provides a pulse laser emission circuit. The pulse laser emission circuit comprises a high voltage generation circuit and a laser emission driving circuit, wherein a high voltage is provided for the driving circuit through the high voltage generation circuit, an laser is emitted by the driving circuit; on and off of an MOS tube are controlled by a booster controller through generating a switch signal, at the instant start moment of the MOS tube, an energy storage inductor is charged through a power source voltage, electric energy is stored in a capacitor through a loop formed by a first diode, after an MOS chip is disconnected, reverse cut-off of the diode is carried out, an output capacitor discharges to a load, and the 160V high voltage is generated; current amplification of the driving signal is carried out through a current amplification chip, the signal after amplification is inputted to a grid of the switch MOS chip, within the turn-off time of the switch MOS tube, a high voltage source provided by the high voltage generation circuit is utilized to charge the energy storage capacitor, the energy storage capacitor realizes instant discharge at the loop of the laser diode within the start time of the switch MOS tube, a heavy current is generated, and the high repetition frequency narrow pulse laser can be emitted.
Owner:NANJING UNIV OF SCI & TECH

Capacitor composed by utilizing semiconductor PN junction capacitance and manufacturing method thereof

The invention discloses a capacitor composed by utilizing a semiconductor PN junction capacitance and a manufacturing method thereof. The capacitor utilizes a semiconductor as a base material, and the capacitance of the capacitor is the semiconductor PN junction capacitance. The capacitor comprises a PN junction, a metal film layer, an electrode bump and an extraction electrode, wherein the PN junction is formed in a specific area by utilizing a diffusion method or an ion implantation method on a high-doping and low-resistance P type or N type semiconductor base material; the metal film layer is manufactured by utilizing a thermal evaporation method, an electron beam evaporation method or a sputtering method on the N type area or the P type area of the semiconductor forming the PN junction; the electrode bump is manufactured by an electroplating method or a screen printing method on the metal film; and the extraction electrode can be arranged on both faces of the semiconductor base material or only on a corrosion area face. The capacitor manufactured by the method of the invention has the characteristics of simple structure, large capacitance density, small parasitic parameters and simple manufacturing technical process, and also has protection function on static electricity and surging, thus being capable of being widely applied to electronic systems with high frequency, high speed and high power.
Owner:NAT CENT FOR ADVANCED PACKAGING

Self-alignment integrated package method of high-density three-dimensional lamination layer

The invention discloses a self-alignment integrated package method of a high-density three-dimensional lamination layer, and aims to provides an integrated package method which employs a BGA welding ball as an interlayer mechanical support for multi-layer substrate self-alignment three-dimensional stack and also can be a signal interconnection passage among high-density layers. The self-alignmentintegrated package method is implemented according to the technical scheme that bonding pads are arranged on a lower surface of a top-layer substrate, an upper surface and a lower surface of an intermediate-layer substrate and an upper surface of a bottom-layer substrate and are used for welding micro BGA welding balls, the micro BGA welding balls are attached onto the upper surface of the intermediate-layer substrate and the upper surface of the bottom-layer substrate, the micro BGA welding balls on the upper surface of the intermediate-layer substrate are corresponding to the lower surface of the top-layer substrate, the micro BGA welding balls on the upper surface of the bottom-layer substrate are corresponding to the lower surface of the intermediate-layer substrate, vertical and interconnection rectangular array micro BGA ball welding is formed, a hollow square boss cavity box body is arranged at the peripheries outside an upper cavity surface of the intermediate-layer substrate 2and an upper cavity surface of the bottom-layer substrate 3, the cavity box body is stacked and placed in a backflow welding furnace by a tool, and self-alignment lamination layer welding is performed to form a package body.
Owner:10TH RES INST OF CETC

Driving reconstruction type circuit based on SRM and vehicle-mounted integrated charging and feeding system

The invention discloses an SRM-based driving reconstruction type circuit and a vehicle-mounted integrated charging and feeding system. According to the circuit, three solid-state relays and a plurality of single-phase voltage type bridge inverters obtained through a DC bus reconstruction mode form an integrated power converter, and the integrated power converter is connected to a power battery and a vehicle-mounted solar photovoltaic panel; the vehicle-mounted integrated charging and feeding system adopting the driving reconstruction type circuit can be suitable for a multi-phase switched reluctance motor, and is combined with a proper control strategy; therefore, various operation modes such as a power battery driving mode, a vehicle-mounted solar photovoltaic panel driving mode, a hybrid driving mode, a regenerative braking mode, a single-phase and three-phase static charging and feeding mode and the like can be realized. The circuit is compact in structure, small in parasitic parameter, low in power consumption and high in power density, switching among different operation modes can be achieved by simply controlling the conducting state of the solid-state relay, and therefore, bidirectional flow of energy among a power battery, a power grid and a motor is achieved.
Owner:HEBEI UNIV OF TECH

LTCC (Low Temperature Co-Fired Ceramic) miniaturization microwave passive device

The invention discloses an LTCC (Low Temperature Co-Fired Ceramic) miniaturization microwave passive device. The LTCC miniaturization microwave passive device comprises dielectric layers and metal layers which are arranged between the dielectric layers; the dielectric layers comprise a first micro-strip dielectric layer, a second micro-strip dielectric layer, a third micro-strip dielectric layer, a first strip line dielectric layer, a second strip line dielectric layer, a third strip line dielectric layer, a fourth strip line dielectric layer, a fifth strip line dielectric layer and a sixth strip line dielectric layer which are arranged from top to bottom in turn; the metal layers comprise a micro-strip line, a first grounding plane, a strip line and a second grounding plane; the micro-strip line is arranged on the first micro-strip dielectric layer; the first grounding plane is arranged between the third micro-strip dielectric layer and the first strip line dielectric layer; the strip line is arranged between the third strip line dielectric layer and the fourth strip line dielectric layer; the second grounding plane is arranged below the sixth strip line dielectric layer. According to the LTCC miniaturization microwave passive device, the multilayer wiring scheme is adopted and accordingly the circuit size and weight is reduced under the same working frequency, the problem of transmission line overlapping is effectively solved, parasitic parameters are reduced, the structure is simple, and the performance is good.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

Optical receiving assembly for hundred trillion-grade 850nm optical communication and preparation method thereof

The invention relates to an optical receiving assembly for hundred trillion-grade 850nm optical communication and a preparation method thereof, and provides an optical receiving assembly for hundred trillion-grade 850nm optical communication, which is compatible with a commercial CMOS process and can replace the hybrid integration in the traditional 850nm optical transceiver and meet the transmission requirement, and a preparation method thereof. The optical receiving assembly is provided with a 850nm optoelectronic single integrated receiving chip, a pipe seat, a pipe cap, a pipe pin and an adapter, wherein the chip is provided with a prepositive amplifying circuit and an optoelectronic detector, and the prepositive amplifying circuit is provided with two mutual resistance type amplifying circuits, a three-grade differential amplifier, an output buffer circuit and a direct current negative feedback circuit. The optoelectronic detector is provided with a low doped P-shaped silicon substrate, a P pit, an N-shaped heavy doping silicon layer, a field oxide layer, an aluminum layer, three SiO2 insulating medium layers and a Si3N4 surface passivating layer from bottom to top in the longitudinal direction. The chip is attached to the pipe seat by a CMOS process; a welding disk of the chip is bonded with the pipe pin by a gold thread; and the pipe cap is covered to be encapsulated with the adapter according to the same shaft.
Owner:XIAMEN UNIV

Symmetric integrated stacked transformer

InactiveCN104037158AIncrease the turns ratioHigh Magnetic InductanceSemiconductor/solid-state device detailsSolid-state devicesHigh rateCenter tap
The invention discloses a symmetric integrated stacked transformer. The symmetric integrated stacked transformer comprises a substrate, a first layer of medium, a second layer of medium and a third layer of medium, which are arranged on the substrate from bottom to top in sequence, a latticed shield grid, which is positioned in the first layer of medium, a primary coil, which is positioned in the second layer of medium, and a secondary coil, which is positioned in the third layer of medium, wherein the shield grid is arranged on the lower plane of the first layer of medium; the primary coil is formed by parallel connection of two circles of square micro-strip coils, which are separated with each other and are symmetrical around the axis, and is arranged on the lower plane of the second layer of medium; the secondary coil is formed by series connection of fives circles of square micro-strip coils, which are separated with each other and are symmetrical around the axis, and is arranged on the lower plane of the third layer of medium; the adjacent coils in pairs are crossly connected with each other at the places close to the axis through two connecting lines, one remaining circle of the coil is directly connected at the place close to the axis through the connecting line of the same metal layer, and a center tap of the secondary coil is arranged on the middle point of the coil. The symmetric integrated stacked transformer has the characteristics of good symmetry, high rate of turn and high magnetic induction coefficient.
Owner:JIANGSU UNIV OF SCI & TECH

Packaging piece based on substrate and adopting slotting technology and manufacturing process of packaging piece

The invention discloses a packaging piece based on a substrate and adopting a slotting technology and a manufacturing process of the packaging piece. The packaging piece is mainly composed of a lead frame, a PAD, a solder ball, conducting adhesive, a chip, a bonding wire and a plastic package body. The PAD and the solder ball are arranged on the lead frame, and a notch is formed in the lead frame. The chip is connected into the notch of the lead frame through the conducting adhesive, and welding spots on the chip are connected with the PAD on the lead frame through the bonding wire. The chip, the bonding wire, the solder ball and the lead frame form a power and signal channel of a circuit. The plastic package body wraps the lead frame, the PAD, the solder ball, the chip and the bonding wire. The procedures of the manufacturing process are wafer thinning, scribing, substrate slotting and ball replacing, chip installing, installed chip baking, bonding, plasma cleaning, post curing, plastic packaging and product finishing. According to the packaging piece based on the substrate and adopting the slotting technology and the manufacturing process of the packaging piece, electric heating performance of the chip is improved, and the performance of the whole packaging piece is improved greatly.
Owner:HUATIAN TECH XIAN
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