Automatic inductance-capacitance calibrating method and circuit

An inductance-capacitor, automatic calibration technology, applied in the direction of improving amplifiers to reduce noise effects, high-frequency amplifiers, etc., can solve problems such as different LC processes, chip sensitivity decline, deviation, etc., to achieve the effect of ensuring accuracy and simple algorithm

Active Publication Date: 2013-02-06
LEADCORE TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the disadvantage of this solution is that different wafers (Wafer), or even the same wafer, have different LC process deviations, resulting in a decrease in chip sensitivity, requiring manual testing and calibration for each chip. Mass production is not applicable

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  • Automatic inductance-capacitance calibrating method and circuit
  • Automatic inductance-capacitance calibrating method and circuit
  • Automatic inductance-capacitance calibrating method and circuit

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Embodiment Construction

[0022] The first embodiment of the present invention relates to an automatic calibration method for inductance and capacitance. This embodiment is applied to the high-precision automatic compensation calibration of the inductance-capacitance (LC) process deviation of the radio frequency front-end module, and is especially suitable for a zero-IF architecture system. The chip of this embodiment includes an input matching network (input matching network, referred to as "IMN"), a low noise amplifier (LNA), a mixer (Mixer), a transimpedance amplifier (TIA), a filter (filter), a module Digital converter (ADC), reference frequency generation circuit phase-locked loop PLL and LO driver (LO buffer).

[0023] The reference frequency V generated by the phase-locked loop PLL RF with the LO driver generating the local oscillator signal V LO After mixing, a direct current (DC) component is generated (I path active, Q path 0). Perform analog-to-digital conversion through the ADC, and then...

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Abstract

The invention relates to the field of communication and discloses an automatic inductance-capacitance calibrating method and circuit. The automatic inductance-capacitance calibrating method comprises the following steps: detecting the signal intensity of corresponding direct current offset when a capacitor array in the inductance and capacitance has different values till the signal intensity of the found direct current offset is maximum, and calibrating the capacitor array in the LC (Inductance-Capacitance) according to the value of the capacitor array corresponding maximum. The LC deviation is achieved by adjusting the value of the capacitor array, so that the working performance and the yield of chips can be improved efficiently, the requirement for mass production can be met, LC technical compensating calibration can be automatically and quickly realized at high precision; and an off-chip SAW (Surface Acoustic Wave) filter is not required, so that the cost is efficiently controlled.

Description

technical field [0001] The invention relates to the communication field, in particular to a radio frequency front-end system. Background technique [0002] The accuracy of LC (inductance and capacitance) in the radio frequency system is very important to the performance of the radio frequency system. In the low noise amplifier, it is generally used as a load frequency selection network to amplify useful signals and suppress out-of-band interference. The larger the Q value, the frequency selection characteristics The more significant, the higher the requirements for LC accuracy, but the process factory can only guarantee the deviation within ±5% of the inductance and ±10% of the capacitance, due to the operating frequency of the LC network ( ) depends entirely on the value of LC. This will cause the frequency to deviate by ±8%. For TD-SCDMA1.9G, the center frequency will deviate from 152MHz, causing the RF front-end frequency to shift, the gain to decrease, and the sensitiv...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03F3/189H03F1/26
Inventor 李海松崔福良周闵新
Owner LEADCORE TECH
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