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ADC (analog-to-digital converter) allowance amplifying circuit of infrared focal plane array detector readout circuit

An array detector and infrared focal plane technology, applied in the field of infrared focal plane array detectors, can solve problems such as performance voltage influence

Active Publication Date: 2013-04-10
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the performance of the existing margin amplifier circuit is greatly affected by the offset voltage of the operational amplifier and the nonlinearity of the capacitance to the voltage.

Method used

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  • ADC (analog-to-digital converter) allowance amplifying circuit of infrared focal plane array detector readout circuit
  • ADC (analog-to-digital converter) allowance amplifying circuit of infrared focal plane array detector readout circuit
  • ADC (analog-to-digital converter) allowance amplifying circuit of infrared focal plane array detector readout circuit

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Embodiment Construction

[0022] figure 1 It is a structural schematic diagram of an ADC (analog-to-digital converter) margin amplification circuit of an infrared focal plane array detector readout circuit according to an embodiment of the present invention. Such as figure 1 As shown, in one embodiment of the present invention, an ADC margin amplifying circuit of an infrared focal plane array detector readout circuit includes: an operational amplifier, a first sampling capacitor C1, a second sampling capacitor C2, and a first feedback capacitor C5 , the second feedback capacitor C6, the first capacitor C3, the first sampling switch P1, the second sampling switch P1_d, the third sampling switch P1_FDOA, the first holding switch P2_d and the second holding switch P2_dg.

[0023] Such as figure 1 As shown, the operational amplifier includes a first input terminal ip, a second input terminal in, a first output terminal outp and a second output terminal outn.

[0024] One end of the first capacitor C3 is...

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Abstract

The embodiment of the invention discloses an ADC (analog-to-digital converter) allowance amplifying circuit of an infrared focal plane array detector readout circuit. The ADC allowance amplifying circuit adopts a telescopic operation amplifier, a first capacitor C3 is added between an equivalent offset voltage source Vos and a first sampling capacitor C1, and a second capacitor C4 is added between the second input end in of the operation amplifier and a second sampling capacitor C2. Therefore, the influence of offset voltage of the operation amplifier on circuit performance can be eliminated and the influence of capacitor-to-voltage nonlinearity on the circuit performance is reduced.

Description

technical field [0001] The invention relates to the field of infrared focal plane array detectors, in particular to an ADC margin amplifying circuit of an infrared focal plane array detector readout circuit. Background technique [0002] All objects emit thermal radiation related to their temperature and material properties. The thermal radiation of objects near the ambient temperature is mostly in the infrared band, with a wavelength of about 1 μm (micrometer) to 24 μm. Infrared radiation provides a wealth of information in the objective world. It is the goal that people pursue to convert invisible infrared radiation into measurable signals and make full use of this information. [0003] Infrared focal plane array is an important optoelectronic device to obtain the infrared radiation information of the scene. Infrared focal plane detectors have been developed rapidly since 1973 when the US Air Force Development Center first proposed the silicide Schottky barrier detector a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03F1/30H03F3/45
Inventor 吕坚庹涛孟祥笙廖宝斌杜一颖
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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