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Thermal interface materials and manufacturing method thereof

A technology of thermal interface materials and manufacturing methods, applied in the direction of heat exchange materials, chemical instruments and methods, etc., can solve the problems of limited types and components of thermal interface materials, unsatisfactory wettability between materials and chip substrates, etc., and achieve excellent Thermal properties and wetting properties, effective and convenient filling, and the effect of overcoming poor interface wettability

Active Publication Date: 2013-06-05
TECHNICAL INST OF PHYSICS & CHEMISTRY - CHINESE ACAD OF SCI +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The technical problem to be solved by the present invention is: the types and components of the existing thermal interface materials are limited, the wettability of the corresponding materials and the chip substrate is not ideal, and there will still be some gaps on the contact surface after filling the interface

Method used

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  • Thermal interface materials and manufacturing method thereof
  • Thermal interface materials and manufacturing method thereof
  • Thermal interface materials and manufacturing method thereof

Examples

Experimental program
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Effect test

Embodiment 1

[0037] Weigh 40 grams of gallium metal, heat it in a water bath to melt it into a liquid state, continue heating in the air, the heating temperature is 100 ° C, use a mechanical stirrer to stir evenly, and the stirring rate is 150 rpm, so that it gradually generates oxygen in the air. The oxidation reaction generates gallium oxide, which is uniformly dispersed in the liquid gallium metal, stirred for 3 hours, and then cooled to room temperature to obtain a liquid gallium metal-based thermal interface material with a certain viscosity.

Embodiment 2

[0039] According to the preparation method of example 1, just change air into high-purity oxygen environment.

Embodiment 3

[0041] According to the preparation method of Example 1, only the liquid metal gallium is replaced by a gallium-indium series alloy (such as 62.5% Ga, 21.5% In, 16% Sn).

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Abstract

The invention discloses thermal interface materials and a manufacturing method of the thermal interface materials. The interface materials are formed by means of heating and oxidization of metals such as gallium, indium, mercury, sodium, potassium, cesium or binary alloy and multicomponent alloy of the cesium. The manufacturing method comprises the following steps: selecting metals such as the gallium, the indium, the mercury, the sodium, the potassium, the cesium or the binary alloy and the multicomponent alloy of the cesium, and enabling the metals or the alloy to become liquid and enabling the liquid metals or the alloy to be placed in air or oxygen through heating. By means of placing the metals such as the gallium, the indium, the mercury, the sodium, the potassium, the cesium or the binary alloy and the multicomponent alloy of the cesium in the air and the oxygen to be oxidized to form the thermal interface materials, wettability between metal-based fluid and each interface can be greatly enhanced, thereby requirements of the thermal interface materials can be met. Due to the good thermal and wetting properties, the thermal interface materials can play significant roles in an aspect of electric chip thermal conductivity of the fields such as cryogenic engineering, boosters of computers, satellites and rockets and laser device.

Description

technical field [0001] The invention belongs to the technical field of thermal interface materials, and in particular relates to a thermal interface material and a manufacturing method thereof. Background technique [0002] With the development of various electronic products to be short, small, light, and thin, they work under high-performance and high-transmission rates, and the operating temperature of various components (such as CPU, etc.) is relatively high. The heating power is also increasing. For example, the working power of Intel Core i7 quad-core CPU is as high as 130W, and the working power of a single AMD Phenom II 965 (Phenom II) quad-core CPU is as high as 140W. The resulting high temperature will reduce the work of the chip. stability, increase the error rate, and at the same time, the thermal stress formed between the inside of the module and its external environment will directly affect the electrical performance, operating frequency, mechanical strength an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C09K5/14C22C29/00
Inventor 高云霞刘静
Owner TECHNICAL INST OF PHYSICS & CHEMISTRY - CHINESE ACAD OF SCI
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