Optical material high temperature transmittance testing device

A technology of optical materials and testing devices, which is applied in the direction of transmittance measurement, etc., can solve the problems of light transmittance decrease, transmittance characteristics deterioration, and inability to reflect material transmittance characteristics, etc., to improve measurement accuracy, good The effect of temperature uniformity

Active Publication Date: 2013-07-03
中国兵器工业第二0五研究所
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Problems solved by technology

As the temperature increases, the infrared transmittance of the material decreases significantly. Taking the infrared germanium material as an example, at room temperature, the transmittance in the mid- and far-infrared band can reach more than 45%, but when the temperature of the material only rises to 60 ℃, the transmittance characteristics will be significantly worse; if the temperature of the material is further increased, such as after reaching 300 ℃, it is almost completely opaque to infrared ligh

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  • Optical material high temperature transmittance testing device
  • Optical material high temperature transmittance testing device
  • Optical material high temperature transmittance testing device

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[0027] The present invention will be further described below in conjunction with the drawings and preferred embodiments.

[0028] Just like figure 1 As shown, the high-temperature transmittance measuring instrument of the preferred embodiment of the present invention is composed of an infrared light source system, a flat mirror group one, a precision temperature control furnace, a flat mirror group two, a focusing mirror, a photoelectric detection processing system and a computer.

[0029] according to figure 2 As shown, the infrared light source system includes an infrared light source 1-1, a collimator lens 1-4, an imaging lens 1-2, a plane mirror 1-3, a chopper 1-5, a filter set 1-6, and an infrared light source 1-1 is a silicon carbide rod lamp, and the collimator 1-4 is an off-axis parabolic reflector. The silicon carbide lamp uses a DC precision steady current source to supply power and provide continuous infrared light. The infrared light beam emitted by the silicon carbid...

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Abstract

The invention discloses an optical material high temperature transmittance testing device. The device adopts a silicon carbide rod as an infrared source, adopts a narrow band filter for filtering and providing infrared monochromatic light, adopts a chopper to modulate the infrared light, adopts a precise temperature control furnace to heat a sample material, uses the alternating current phase locked amplification technology to measure an infrared signal, and uses a planar reflecting mirror group to split one beam of infrared light into two beams for a sample light path and a reference light path respectively. As a result, the high temperature transmittance of the infrared band with temperature ranging from room temperature to 700 DEG C and wavelength ranging from 1 micron to 14 microns can be measured.

Description

technical field [0001] The invention relates to a device for measuring transmittance of optical materials in the field of optical metrology and measurement, in particular to a device for measuring high temperature transmittance of optical materials in the infrared band. Background technique [0002] Transmittance is one of the most basic optical performance parameters of optical materials, and it is also the basis of optical system design. Whether it is optical design applications or optical material production, it is necessary to accurately measure the transmittance value of optical materials. [0003] Since optical systems generally work at room temperature, the transmittance of optical materials at room temperature is usually only measured. However, in some special applications, such as missile fairings, due to the high-speed flight of the aircraft, the temperature of the fairing material will rise rapidly under the action of aerodynamics, and the temperature of the facin...

Claims

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Application Information

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IPC IPC(8): G01N21/59
Inventor 王雷许荣国辛舟阴万宏谢毅
Owner 中国兵器工业第二0五研究所
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