Method for quickly semi-quantifying GH4169 alloy trace elements
A GH4169, trace element technology, applied in the direction of material excitation analysis, fluorescence/phosphorescence, etc., can solve problems such as difficult to meet production needs, unstable graphite furnace performance, long analysis cycle, etc., to facilitate repeated tests and improve material inspection Efficiency and the effect of shortening the analysis cycle
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[0022] A fast semi-quantitative method for trace elements of GH4169 alloy, using XRF-1800 fluorescence spectrometer, using fluorescence spectroscopy to semi-quantify trace elements of GH4169 alloy, the content of the three elements in the sample is less than or equal to 0.005% respectively is a qualified sample ;
[0023] First, turn on the XRF-1800 fluorescence spectrometer, initialize the instrument, set the X fluorescence spectrometer, and adjust the instrument to adapt to the analysis of trace elements. The setting parameters are as follows: excitation voltage: 60KV, excitation current: 60mA, measurement Slit: standard, analysis crystal: LiF, detector: SC, measurement time: 20s, measurement method: P-2BG; measurement angle: 28.20 for Pb, 14.04 for Sn, 33.94 for As; pulse range: 12-72 for Pb , Sn is 28-68, As is 36-76; background correction position: Pb is 27.94, 28.54; Sn is 13.60, 14.40; As is 33.64, 34.24;
[0024] Measure the GH4169 standard substance, find out the 1% ...
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