Integrated wafer-level vacuum packaged MEMS device and manufacturing method thereof
A device manufacturing method and vacuum packaging technology, which are applied in the direction of electric solid devices, semiconductor devices, manufacturing microstructure devices, etc., can solve the problems of reducing the manufacturing cost of MEMS devices, achieve reduced energy consumption, high-quality MEMS device manufacturing processes, and reduce Effect of Residual Stress Effect
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no. 1 example
[0054] figure 1 It is a flow chart of the method for manufacturing a MEMS device integrated in wafer-level vacuum packaging according to the first embodiment of the present invention, Figures 2A-2P is a process flow diagram of the manufacturing method of the first embodiment of the present invention. Such as figure 1 As shown, the manufacturing method includes:
[0055] Step 101, forming a MEMS structure on a single crystal silicon wafer substrate. Described step 101 comprises three sub-steps:
[0056] Step 101A, forming a mask layer on the single crystal silicon wafer substrate.
[0057] Such as Figure 2A As shown, a mask layer 202 is deposited on a single crystal silicon wafer substrate 201, the mask layer 202 can be thermally grown silicon oxide, low pressure chemical vapor deposition (LPCVD) silicon oxide Or plasma chemical vapor deposition (PECVD) silicon oxide.
[0058] Crystallographic orientations refer to the columns of atoms in different directions through ...
no. 2 example
[0103] Figures 3A-3C It is a process flow chart of the manufacturing method of the second embodiment of the present invention. The process flow of the second embodiment of the present invention is exactly the same as the process of step 101 to step 108 in the first embodiment, and will not be repeated here. On the basis of step 108, continue the process of the first embodiment of the present invention. The technical process of three embodiments, including:
[0104] Step 109', forming a sealing structure on the covering layer, and an opening structure for metal contact is formed on the sealing structure. The step 109' includes two sub-steps:
[0105] Step 109'A, forming a sealing layer on the covering layer, patterning the covering layer and sealing layer to form an opening structure, wherein the opening structure is aligned with the unremoved second sacrificial layer and third sacrificial layer .
[0106] Such as Figure 3A As shown, a sealing layer 212 is formed on the ...
no. 3 example
[0116] Figure 4 It is a schematic structural diagram of the integrated wafer-level vacuum packaged MEMS device according to the third embodiment of the present invention, wherein the MEMS device is manufactured by using the process flow of the first embodiment of the present invention. Such as Figure 4 As shown, the device includes:
[0117] A single crystal silicon wafer substrate 41 .
[0118] The MEMS structure 42 formed by etching the single crystal silicon wafer substrate 41 .
[0119] The electrode layer 43 disposed on the MEMS structure 42 is used to control the MEMS structure 42 .
[0120] The cover layer 44 arranged above the electrode layer 43, the first cavity formed between the cover layer 44 and the MEMS structure 42 and the first cavity formed between the MEMS structure 42 and the single crystal silicon wafer substrate The second cavity between the bottom 41, wherein the cover layer 44 is electrically connected to the electrode layer 43, and an opening stru...
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