Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Non-corrosive polishing solution of mechanical equipment

A kind of mechanical equipment and non-corrosion technology, applied in the field of polishing fluid, can solve the problems of unsatisfactory substrate materials, increased capacitance of the conductive layer, failure to achieve the perfect combination of manufacturing cost and technical performance, etc., to achieve the goal of reducing surface pollutants and inhibiting the polishing rate Effect

Inactive Publication Date: 2013-12-25
QINGDAO CHENGTIAN WEIYE MACHINERY MFG
View PDF0 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Due to the high dielectric constant of the traditional dielectric layer material, the capacitance between the conductive layers will increase, which will affect the speed of the integrated circuit and reduce the efficiency. With the complexity and refinement of the integrated circuit, this base material It is increasingly unable to meet the technical requirements of more advanced processes. The introduction of low dielectric materials into the substrate is an inevitable trend in the development of integrated circuit technology, and many polishing slurries for low dielectric materials have been produced.
However, the current low-dielectric material polishing fluids in the prior art have not achieved the perfect combination of manufacturing cost and technical performance.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0008] A non-corrosive polishing solution for mechanical equipment, characterized in that it comprises the following parts by weight: 21-30 parts of sodium salicylate, 9-12 parts of sodium acetate, 8-10 parts of sodium oxalate, 2-8 parts of sodium benzoate 3-6 parts of potassium dihydrogen phosphate, 1-2 parts of antistatic agent, 4-9 parts of methyl silicone oil, 8-13 parts of liquid stone ester, 3-8 parts of stearic acid, 7-10 parts of impurity remover , 11-18 parts of treatment agent, 3-5 parts of titanium dioxide, 2-4 parts of potassium dihydrogen phosphate, 1-2 parts of molecular sieve, 1 part of diatomaceous earth, 2-4 parts of sodium borate, 1 part of mica powder with lamellar structure , 1-2 parts of hollow glass microspheres.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a non-corrosive polishing solution of mechanical equipment, which comprises the following substances in parts by weight: 21-30 parts of sodium salicylate, 9-12 parts of sodium acetate, 8-10 parts of sodium oxalate, 2-8 parts of sodium benzoate, 3-6 parts of monopotassium phosphate, 1-2 parts of antistatic agent, 4-9 parts of methyl silicone oil, 8-13 parts of liquid halloysit, 3-8 parts of stearic acid, 7-10 parts of purifier, 11-18 parts of treatment agent, 3-5 parts of titanium dioxide, 2-4 parts of monopotassium phosphate, 1-2 parts of molecular sieve, 1 part of kieselguhr, 2-4 parts of sodium borate, 1 part of mica powder in a laminated structure and 1-2 parts of hollow glass microsphere. The chemical machinery polishing solution can inhibit the polishing velocity of a low dielectric material, has a small influence on the removal velocity of copper and silicon dioxide, and can reduce pollutants on the surface of a polished material.

Description

technical field [0001] The invention relates to a non-corrosive polishing liquid for mechanical equipment. Background technique [0002] Due to the high dielectric constant of the traditional dielectric layer material, the capacitance between the conductive layers will increase, which will affect the speed of the integrated circuit and reduce the efficiency. With the complexity and refinement of the integrated circuit, this base material It is increasingly unable to meet the technical requirements of more advanced processes. The introduction of low dielectric materials into the substrate is an inevitable trend in the development of integrated circuit technology, and many polishing slurries for low dielectric materials have been produced. However, none of the low-dielectric material polishing fluids in the prior art has achieved the perfect combination of manufacturing cost and technical performance. Contents of the invention [0003] The technical problem to be solved by ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C09G1/08
Inventor 张竹香
Owner QINGDAO CHENGTIAN WEIYE MACHINERY MFG
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products