Suspended force-sensitive sensor chip capable of eliminating encapsulation stress and manufacture method thereof

A sensor chip and packaging stress technology, which is applied in the measurement of the property force of piezoresistive materials, processes used to produce decorative surface effects, decorative arts, etc., can solve problems such as adverse effects on detection performance of force-sensitive sensors, and The effect of suppressing adverse effects, good stability and simple structure

Active Publication Date: 2014-03-26
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
View PDF8 Cites 28 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The technical problem mainly solved by the present invention is to provide a floating force-sensitive sensor chip and a manufacturing method that eliminates packaging stress, which is used to solve the problem of packaging substrates of different materials in different physical environments during the application process of the existing force-sensitive sensor chip The packaging stress generated by the deformation in the environment has a negative impact on the detection performance of the force-sensitive sensor, thereby realizing the low-cost, high-efficiency, friendly and convenient packaging of the force-sensitive pressure sensor chip with different material packaging substrates

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Suspended force-sensitive sensor chip capable of eliminating encapsulation stress and manufacture method thereof
  • Suspended force-sensitive sensor chip capable of eliminating encapsulation stress and manufacture method thereof
  • Suspended force-sensitive sensor chip capable of eliminating encapsulation stress and manufacture method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0059] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0060] see Figure 1 to Figure 2 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of ​​the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arb...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a suspended force-sensitive sensor chip capable of eliminating encapsulation stress and a manufacture method thereof. The chip comprises a monocrystalline silicon substrate, and a cantilever beam and a pressure sensor which are both integrated on the monocrystalline silicon substrate, wherein the cantilever beam and the pressure sensor are integrated on the same surface of the monocrystalline silicon substrate by a monocrystalline silicon substrate single-side microprocessing method, the pressure sensor is integrated on the structure of the cantilever beam, and a reference pressure cavity is directly embedded in the cantilever beam. The dynamic properties of a freedom of movement structure at the tail end of the cantilever beam are fully utilized by the suspended force-sensitive sensor chip, the adverse effect of the outer encapsulation stress of the chip on the detection performance of the force-sensitive sensor can be effectively inhibited by the pressure sensor on the cantilever beam, the friendly encapsulation of encapsulation base plates of different materials is realized by the force-sensitive sensor, and the detection stability of the sensor and encapsulation environment adapting reliability are improved. The suspended force-sensitive sensor chip has the advantages of novel design, simple structure, low encapsulation cost, small chip size and low chip cost. The requirement of massive production is met.

Description

technical field [0001] The invention belongs to the technical field of silicon micromechanical sensors. It relates to a force-sensitive sensor chip and a manufacturing method thereof, in particular to a suspension-type force-sensitive sensor chip and a manufacturing method thereof that eliminate packaging stress, which can effectively suppress the adverse effects of packaging stress on the detection performance of a force-sensitive sensor, and is especially suitable for Friendly encapsulation of different material encapsulation substrates. Background technique [0002] In recent years, with the rapid development of micro-electromechanical systems (MEMS) technology, silicon-based pressure sensors, as one of the traditional mechanical detection devices of MEMS sensors, have been widely used in aerospace, biochemical medicine, life sciences, automotive electronics and other fields. For example, the detection accuracy, linearity, and repeatability of pressure sensors in force-s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01L1/18B81B3/00B81C1/00
Inventor 李昕欣王家畴
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products