Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

116 results about "Capacitive accelerometer" patented technology

A capacitive accelerometer is a type of accelerometer device that measures the acceleration on a surface using capacitive sensing techniques. It has the ability to sense static and dynamic acceleration on equipment or devices - enforced by human or mechanical forces - and converts this acceleration into electrical currents or voltage.

Monolithic integrated CMOS (Complementary Metal Oxide Semiconductor) MEMS (Micro-electromechanical Systems) multilayer metal three-axis capacitive accelerometer and manufacturing method thereof

The invention provides a monolithic integrated three-axis accelerometer and a manufacturing method thereof so as to solve the defects in structure and manufacturing technology of the existing structural capacitive accelerometer. Three layers of metal Al thin films are deposited in the direction of an axis Z so as to form a comb pair sensitive electrode; four layers of metal Al/SiO2 thin films are deposited in the directions of an axis X and an axis Y so as to form comb pair sensitive electrodes, and the accelerations of the three axis directions are detected simultaneously by a single integrated structure. The accelerometer and the manufacturing method thereof have the following positive technical effects: the interconnection stray capacitance among accelerator devices in three axis directions is lowered remarkably, and high detection accuracy and lower noise performance are realized; since the accelerometer is provided with the multiple metal layers, compared with a microaccelerometer manufactured from the same material, namely polycrystalline silicon, the accelerometer is more flexible in wiring; a foldable beam is used in the structure of the accelerometer, so that the own stress of the accelerometer is released better, and therefore the influence of the stress on the system can be reduced effectively.
Owner:HEFEI UNIV OF TECH

Temperature compensating device for micro-machined capacitive accelerometer

The invention discloses a temperature compensating device for a micro-machined capacitive accelerometer. The temperature compensating device mainly comprises a coherent demodulator, a low pass filter and a temperature compensating circuit, wherein an output end of the coherent demodulator is connected with an input end of the low pass filter; and the output end of the low pass filter is connectedwith the input end of the low temperature compensating circuit. By taking the internal capacitance which changes with the temperature of the micro-machined capacitive accelerometer as a compensating reference signal of an output signal of the accelerometer, the temperature compensating device does not need a thermistor or an integrated temperature sensor for measuring the temperature of an acceleration sensor, so the structure of the temperature compensating device is simplified, and the cost is reduced; the influence on compensating precision due to temperature measurement error is eliminated, and the temperature compensating precision is improved; and no temperature sensor is needed to be arranged and used on the micro-machined capacitive accelerometer, so a temperature measurement error due to a temperature gradient of a metal pipe shell of the acceleration sensor is avoided, and the temperature compensating precision is further improved.
Owner:ZHEJIANG UNIV

Method for manufacturing monolithic polysilicon cantilever structure

The invention relates to a method for manufacturing a monolithic polysilicon cantilever structure. In the invention, a processing step of the polysilicon cantilever structure is inserted in a conventional BiCMOS (Bipolar Complementary Metal Oxide Semiconductor) technical process, the deposition and the annealing of polysilicon are finished and an MEMS (Micro-Electro-Mechanical Systems) high-temperature process is prevented from influencing on the metalation process before the metalation process. In the release process of the polysilicon cantilever structure, a special etching solution is adopted, and a negative photoresist is used as a post of the polysilicon cantilever structure so as to effectively avoid the problem of substrate adhesion in the cantilever structure release process by using a wet method. The method provided by the invention solves the technical problems of compatibility between a manufacture process of the polysilicon cantilever structure and a processing process of a BiCMOS circuit, realizes the monolithic integration of the polysilicon cantilever structure and a BiCMOS signal processing circuit, and can be widely applied to the monolithic integration manufacture field of MEMS sensors, such as capacitive accelerometers, gyroscopes, and the like.
Owner:NO 24 RES INST OF CETC

Test device and test method for thermal sensitivity drift of impact accelerometer

The invention relates to a test device for testing the change of the sensitivity output of an impact accelerometer with temperature. The test device comprises a temperature control box, a metal rod, apneumatic system, an accelerometer signal amplifier, a laser interferometric speed measuring device, and a computer for data sampling and data processing; the metal rod is horizontally supported by asupporting structure and can move freely axially; one end of the metal rod is aligned with the pneumatic system; the other end of the metal rod fixes an accelerometer to be tested and is arranged inthe temperature control box; the output signals of the accelerometer are inputted to the signal amplifier through a wire; the laser interferometric speed measuring device emits laser onto the metal rod and receives reflected laser; the output signals of the accelerometer signal amplifier and the laser speed measuring device are connected with the computer through data wires; and a relationship between the sensitivity output of the accelerometer to be tested and temperature is obtained by means of an absolute method. The test device of the invention has the advantages of large impact acceleration, directness and relatively high accuracy.
Owner:SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products