Passive intermodulation outlier quick locating method based on vector network analyzer
A technology of vector network analysis and passive intermodulation, which is applied in the field of rapid positioning of passive intermodulation abnormal points based on vector network analyzers, can solve problems such as loss of function, complex hardware composition, and influence of filter performance on measurement results. Achieve good adaptability, increase product added value, and improve accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0038] The general principle of passive intermodulation (PIM) test system composed of network analysis is: use one network analyzer as a signal source and receiver (spectrum analyzer), and use one signal source as another signal transmitting unit. The two test signals enter the power amplifier module respectively, and after being amplified, enter the test device for combination to form a 2x43dBm dual-tone signal, which is loaded on the device under test. The reflected PIM signal passes through the filter channel of the test device, and the filtered PIM interference enters the network analyzer for measurement, mainly measuring its amplitude or power. Therefore, the system includes 1 network analyzer, 1 signal source, 2 power amplifiers, 1 set of test equipment and accessories, or use 1 receiver, 1 signal source and 1 control computer to replace the network analyzer to form a measurement system, and The rapid location function of PIM interference abnormal points cannot be realiz...
Embodiment 2
[0059] On the basis of the above-described embodiments, the present invention is further described. A method for quickly locating passive intermodulation abnormal points based on a vector network analyzer of the present invention includes the following steps:
[0060] Step 1: The first signal source of the VNA generates the first signal and the second signal of the single-frequency signal of the test frequency, and the first signal enters the frequency multiplication unit through power division or coupling; the second signal passes through VNA port input to power amplifier;
[0061] Step 2: The second signal source of the VNA generates the third signal and the fourth signal of the single-frequency signal of the test frequency, and the third signal enters the frequency multiplication unit through power division or coupling; the fourth signal passes through VNA port input to power amplifier;
[0062] Step 3: The first signal and the third signal are mixed and filtered by the fr...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com