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Spectral measurement device and spectral measurement method based on elasto-optical effect

A spectral measurement and elastic-optical effect technology, applied in the field of optical measurement, can solve the problems of narrow spectral measurement range, low resolution, vibration sensitivity, etc., and achieve the effect of wide spectral measurement range, high resolution and low cost

Inactive Publication Date: 2015-06-10
NANJING UNIV OF POSTS & TELECOMM
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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to overcome the technical problems existing in the prior art, such as high cost, difficult manufacture, sensitivity to vibration, low resolution, and narrow spectral measurement range, and provide a spectral measurement based on the elastic-optical effect. Device and Spectral Measurement Method

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  • Spectral measurement device and spectral measurement method based on elasto-optical effect
  • Spectral measurement device and spectral measurement method based on elasto-optical effect
  • Spectral measurement device and spectral measurement method based on elasto-optical effect

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Embodiment Construction

[0026] The technical scheme of the present invention is described in detail below in conjunction with accompanying drawing:

[0027] The idea of ​​the present invention is to change the refractive index of the incident light propagating in the medium by using the elastic-optic effect, so that under the same external force, the phase difference between the two beams of birefringent light after the light of different wavelengths passes through the photoelastic material is different. The polarizer achieves the purpose of changing the intensity of the outgoing light. The spectrum of the incident light to be measured is obtained by measuring the light intensity under different external forces and solving a linear equation set.

[0028] The elastic-optic effect refers to the fact that non-crystals such as plastics and glass are isotropic under normal conditions without birefringence. But when they are subjected to an external force, they become anisotropic and exhibit birefringence...

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Abstract

The invention discloses a spectral measurement device based on an elasto-optical effect, and belongs to the technical field of optical measurement. The spectral measurement device comprises a first polarizing film, a photoelastic material, a second polarizing film, an optical detector and a pressure applying device capable of applying a series of different pressures on the photoelastic material, wherein the first polarizing film, the photoelastic material, the second polarizing film, the optical detector and the pressure applying device are arranged along incident light in sequence, and the polarization direction of the first polarizing film is neither parallel nor perpendicular to the direction of the optical axis of the photoelastic material. The invention further discloses a spectral measurement method based on the elasto-optical effect. The refraction index of incident light spread in media is changed by utilizing the elasto-optical effect, and thus when the photoelastic material is under same external force, phase differences between two beams of double-refraction light after light of different wavelengths passes through the photoelastic material are different, the polarizing films are combined, and the purpose of changing emergent light intensity is achieved. The frequency spectrum of incident light to be measured is obtained by measuring light intensity under different external forces and solving a system of linear equations. The spectral measurement device and the spectral measurement method based on the elasto-optical effect have the advantages of being low in cost, high in resolution, wide in spectral measurement range and the like.

Description

technical field [0001] The invention relates to a spectrum measurement device, in particular to a spectrum measurement device and a spectrum measurement method based on the elastic-optic effect, belonging to the technical field of optical measurement. Background technique [0002] A spectrometer is an optical instrument for studying and measuring the wavelength, intensity characteristics and changing laws of optical radiation. It applies the principle of dispersion, diffraction or optical modulation of light to separate the light radiation of different wavelengths according to certain rules to form a spectrum, and cooperates with a series of optics, precision machinery, electronics and computer systems to realize the wavelength and intensity of light radiation. precision measurement and research. The spectrometer has the advantages of high analysis accuracy, large measurement range, and fast speed. Nowadays, its application fields have become more and more extensive, such a...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/45
Inventor 许超杨涛蔡祥宝李兴鳌周馨慧仪明东何浩培黄维
Owner NANJING UNIV OF POSTS & TELECOMM
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