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SPR sensor cell and SPR sensor

A sensor element and detection unit technology, applied in the direction of optical components, instruments, scientific instruments, etc., can solve the problems of fixed analysis samples and difficult formation of metal films, etc., and achieve the effect of excellent detection sensitivity

Inactive Publication Date: 2014-05-14
NITTO DENKO CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In an SPR sensor including an optical fiber, the tip of the optical fiber has a fine cylindrical shape, and therefore, there are problems in that it is difficult to form a metal thin film and to fix an analysis sample on the optical fiber.

Method used

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  • SPR sensor cell and SPR sensor
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  • SPR sensor cell and SPR sensor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0069] By using such as image 3 The stamper systems shown in (a) to 3(e) form optical waveguides. Specifically, a fluorine-based UV curable resin ("OP38Z" (trade name), manufactured by DIC Corporation) as a material for forming the under clad layer was applied to a mold having a core layer corresponding to the under clad layer Forming part of the protrusion, the resin is cured with ultraviolet light to form the lower cladding. The refractive index of the lower cladding layer thus obtained was 1.372. The lower cladding has a length of 80 mm, a width of 80 mm, and a thickness of 150 μm, and a groove portion having a width of 50 μm and a thickness (depth) of 50 μm for forming the core layer is formed in the lower cladding. After the under cladding layer was peeled off from the mold, the groove portion was filled with a fluorine-based UV-curable resin (“OP40Z” (trade name), manufactured by DIC Corporation) as a material for forming a core layer to form a core layer. The refrac...

Embodiment 2

[0074] An SPR sensor element and an SPR sensor were produced in the same manner as in Example 1 except that a cap layer (thickness: 20 nm) was formed by sputtering zinc selenide (ZnSe). The SPR sensor thus obtained was evaluated in the same manner as in Example 1. Table 1 shows the results.

Embodiment 3

[0076] An SPR sensor element and an SPR sensor were produced in the same manner as in Example 1 except for forming a cover layer (thickness: 40 nm) by sputtering zinc selenide (ZnSe). The SPR sensor thus obtained was evaluated in the same manner as in Example 1. Table 1 shows the results.

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Abstract

The present invention relates to an SPR sensor cell and an SPR sensor with high detection sensitivity. The SPR sensor cell of the present invention comprises a detection part, and a sample arrangement part adjoining the detection part. The detection part comprises an underclad layer, a core layer which is disposed such that at least a part thereof adjoins the underclad layer, a metal layer for coating the core layer, and a coating layer for coating the metal layer. The respective coating layer is formed of a material which has a band gap (Eg) of over 1.0 eV and below 7.0 eV, and an index of refraction of the coating layer is higher than an index of refraction of the core layer.

Description

technical field [0001] The present invention relates to SPR sensor elements and SPR sensors. More specifically, the present invention relates to SPR sensor elements and SPR sensors including optical waveguides. Background technique [0002] So far, in the fields of chemical analysis, biochemical analysis, etc., surface plasmon resonance (SPR) sensors including optical fibers have been used. In an SPR sensor including an optical fiber, a metal thin film is formed on the outer peripheral surface of the tip portion of the optical fiber, and an analysis sample is fixed on the optical fiber into which light is introduced. Of the introduced light, light having a specific wavelength generates surface plasmon resonance in the metal thin film and attenuates its light intensity. In this SPR sensor, the wavelength of light generating surface plasmon resonance generally changes with the refractive index of an analysis sample fixed on an optical fiber. Therefore, if the wavelength at ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/27G01N21/03
CPCG01N21/553G02B6/1226G02B6/132G02B6/138G02B2006/12138G01N33/54373G01N21/41G01N21/554G01N2201/08
Inventor 绀谷友广
Owner NITTO DENKO CORP