Method for increasing crystal pulling stability of large-diameter monocrystalline silicon with diameter of over 400 mm
A silicon crystal pulling and stability technology, applied in the self-melting liquid pulling method, single crystal growth, single crystal growth, etc. , dislocation increase, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0024] The size of the quartz crucible in the production process of producing monocrystalline silicon by the Czochralski method is set to 800mm; in the isometric growth step of producing monocrystalline silicon by the Czochralski method, the range value of the liquid opening distance is controlled at the initial stage of equal diameter to be 15mm , and the furnace pressure is 22 Torr, the rotation speed of the quartz crucible is 5 rpm, the rotation speed of the crystal is 8 rpm, the isodiametric pulling speed is 0.75 / min, and the inlet argon flow rate is 1.2 m / s.
[0025] The analysis of single crystal silicon rods with an equal diameter of 300 mm shows that the distribution curve of the solid-liquid interface is as follows: figure 2 As shown, the height at the center of the solid-liquid interface (point A) and the maximum point of the solid-liquid interface curve (point B) are analyzed, and it can be concluded that compared with the unimproved process, the solid Fluctuation ...
Embodiment 2
[0027] The size of the quartz crucible in the production process of producing monocrystalline silicon by the Czochralski method is set to 900mm; ~20mm, and the furnace pressure is 22Torr, the rotation speed of the quartz crucible is 6rpm, the rotation speed of the crystal is 9rpm, the isometric pulling speed is 1mm / min, and the inlet argon gas flow rate is 1.2m / s.
[0028] The analysis of single crystal silicon rods with an equal diameter of 300 mm shows that the distribution curve of the solid-liquid interface is as follows: Figure 5 As shown, the height at the center of the solid-liquid interface (point A) and the maximum point of the solid-liquid interface curve (point B) are analyzed, and it can be concluded that compared with the unimproved process, the solid Fluctuation intensity of liquid interface decreased from 7.39% to 5.5%; for further details, please refer to Figure 6 and Figure 7 , Figure 6 It is the cloud diagram of the stress distribution of the monocryst...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 