Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multi-mode non-linear optical microscopy imaging method and device

A nonlinear optical and microscopic imaging technology, used in Raman scattering, material excitation analysis, etc.

Active Publication Date: 2015-02-04
FUJIAN NORMAL UNIV
View PDF7 Cites 29 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since various nonlinear optical imaging technologies have only been developed for about 10 years since they were first applied in the laboratory, they are still in the process of their own development.
So far, it has not been seen that several nonlinear optical microscopy imaging technologies with common technologies are coupled in one platform or system, that is, on the same platform or system, multi-mode nonlinear optical microscopy imaging of the target is realized , so as to realize the in situ characterization and acquisition of various specific information on the target

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-mode non-linear optical microscopy imaging method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] like figure 1 As shown, a multi-mode nonlinear optical microscopic imaging device includes a laser system 1, the output direction of the laser system 1 is sequentially provided with a first pulse laser power adjustment unit and a time delay unit 5 along the first optical path, and the The output direction of the laser system 1 is provided with a second pulse laser power adjustment unit along the second optical path, and the output direction of the time delay unit 5 and the second pulse laser power adjustment unit are jointly and sequentially provided with a first dichroic mirror 9, a laser A beam scanning unit 10 , an objective lens 16 and an object stage 19 for placing a sample 17 to be measured.

[0021] In this embodiment, the first pulse laser power adjustment unit includes a first half-wave plate 2 and a first polarization beam splitter 3 arranged in sequence along the first optical path, and the second pulse laser power adjustment unit includes a second The secon...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a multi-mode non-linear optical microscopy imaging method and device. The multi-mode non-linear optical microscopy imaging device mainly comprises a laser system, an optical scanning microscope and a non-linear optical signal detecting and acquiring system. The multi-mode non-linear optical microscopy imaging device can work in a single-laser-beam mode and a dual-laser-beam mode and can realize multi-mode non-linear optical microscopy imaging such as two-photon excited Fluorescence (TPEF) imaging, multiphoton high-order harmonic (such as second harmonic generation SHG, and third harmonic generation THG) scattering imaging, coherent Raman scattering (such as anti-Stokes CARS) microscopy imaging) on isolated biological tissues and living cells, so that various non-linear specific optical signals of biological tissue samples can be obtained in situ, so that the important basis is provided for the optical diagnosis and deep analysis of the samples. Besides, a reflection measurement manner disclosed by the invention can be further directly applied to the acquiring of various non-linear specific optical signals of live animals and the microscopy imaging.

Description

technical field [0001] The invention relates to a multi-mode nonlinear optical microscopic imaging method and device. Background technique [0002] The appearance of the microscope has changed people's methods and viewpoints of understanding the world, and it is one of the important inventions in the history of human science development. Due to its advantages of non-destructive and non-invasive, optical microscope has developed into an important tool in current natural science, especially life science research. In particular, laser confocal scanning microscopy imaging and various nonlinear optical microscopy imaging techniques, such as two-photon excited fluorescence imaging, second harmonic scattering imaging and coherent Raman imaging, which emerged in the late nineteenth century, are due to their With high spatial resolution and three-dimensional optical tomography capabilities of thick tissues, optical microscopic imaging technology has been widely used in basic researc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/65
Inventor 杨洪钦邱彩敏陈建玲谢树森王瑜华李晖
Owner FUJIAN NORMAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com