Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for expressing gamma/gamma' phase crystal lattice mismatching degree in nickel-based high-temperature alloy

A technology of nickel-based superalloy and lattice mismatch, which is applied in the direction of material analysis using radiation diffraction, etc., can solve the problems of expensive, complicated and cumbersome sample preparation, and achieve simple sample preparation, convenient operation, and reduced errors. Effect

Active Publication Date: 2015-02-11
ELECTRIC POWER RES INST OF GUANGDONG POWER GRID +2
View PDF7 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, it can be seen from the name that these instruments are high-precision equipment, which are very complicated and expensive, and some methods of sample preparation are also relatively complicated and cumbersome, such as converging electron beam and characterization under transmission electron microscope.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for expressing gamma/gamma' phase crystal lattice mismatching degree in nickel-based high-temperature alloy
  • Method for expressing gamma/gamma' phase crystal lattice mismatching degree in nickel-based high-temperature alloy
  • Method for expressing gamma/gamma' phase crystal lattice mismatching degree in nickel-based high-temperature alloy

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] The directionally solidified DD483 (C 0.07, Cr 12.26, Mo 1.99, Co 9.19, W 3.76, Al 3.48, Ti 4.00, Ta 4.86, B 0.015, other Ni, wt.%) single crystal superalloy was tested and characterized by this method. The lattice mismatch degree of the γ / γ' phase, the test and characterization process is as follows:

[0042] S1 first conducts θ-2θ linkage scanning on the sample, the scanning step is 0.002°, and the scanning speed is 0.25° / min, and the diffraction range of the (002) plane of the crystal is determined to be 50° to 52°;

[0043] S2 then equally divides the detector 2θ angle range (50-52°) with a step size of 0.02°, that is, 100 equal parts;

[0044] S3 fixes the 2θ angle, performs ω scan, sets the range of ω angle (rotation angle of the sample stage) to ±2°, the step size is 0.008°, and the scanning speed is 4° / min; record ω, 2θ and intensity values;

[0045] S4 normalizes the diffraction intensity, imports the three sets of data into matlab software, and obtains the co...

Embodiment 2

[0070] This method is used to test and characterize the lattice mismatch degree of γ / γ' phase in the heat-treated DD483 single crystal superalloy. The heat treatment system is 1,204℃ / 1h+1,265℃ / 1h / air cooling+1,084℃ / 4h / furnace cooling, The test characterization process is the same as that in Example 1, and the test results are shown in Table 2. In the alloy of this embodiment, the amount of Cr+Co+Mo reaches 23.44wt%, while the content of Ta+W is 8.62wt%, so the heat treatment process makes the amount of alloy elements diffused into the γ' phase greater than the amount diffused into the γ phase The amount makes the lattice misfit degree increase in the direction of increase, and the same is true for the test and characterization results.

[0071] Table 2 Lattice constants and mismatch degrees of the γ / γ' phases of the heat-treated samples

[0072] Lattice constants and degrees of mismatch

Embodiment 3

[0074] This method is used to test and characterize the lattice mismatch of the γ / γ' phases in the creep state DD483 single crystal superalloy. The sample is taken from a place 5cm away from the fracture after creep fracture, and the observation surface is perpendicular to the creep tensile stress. , is the (002) plane, the creep condition is 982°C / 250MPa, the test characterization process is the same as that of Example 1, and the test results are shown in Table 3. In the literature Acta Metall Mater 1991; 39:2783-94, the two-phase misfit degree of the (002) plane of the single crystal SRR99 alloy after heat treatment and creep was studied with a twin crystal diffractometer, which changed from -0.14 after heat treatment to after creep. 0.04, its trend of change is consistent with that of the alloy in this example, indicating that the test result of this test method is correct.

[0075] Table 3 Lattice constants and mismatch degrees of γ / γ' phases of creep samples

[0076] ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for expressing the gamma / gamma' phase crystal lattice mismatching degree in nickel-based high-temperature alloy. According to the method, conventional diffraction and omega swinging curve testing technologies are combined, a two-dimensional scanning mode is obtained, an isostrength map of diffraction information is expressed by a two-dimensional positive space or reverse space, the position of the diffracted crystal surface is obtained, the crystal lattice constant of the diffracted crystals is obtained, then, the two-phase mismatching degree is calculated according to the crystal lattice constant, the crystal lattice constant and the mismatching degree determined in the mode have better mean value significance, errors are reduced to the maximum degree, and higher accuracy is realized. The method provided by the invention has the advantages that the sample preparation is simple, the operation is convenient, the in-situ measurement of blocky solid can be realized, in addition, the samples rotate, the diffraction regions are increased, or even an embedded structure is reflected out, the requirement on equipment is not high, used x-ray equipment only needs to be capable of realizing the independent rotation of an incidence angle (samples) and an diffraction angle, the smaller distribution divergence of diffraction points in the reverse space is the better, and the best distribution is dotted distribution.

Description

technical field [0001] The invention relates to a method for characterizing the γ / γ′ phase lattice mismatch degree of a nickel-based superalloy. Background technique [0002] The γ′ phase is the main strengthening phase in nickel-based superalloys, and its volume fraction accounts for 60-70% in advanced superalloys. It is embedded in the matrix γ phase in a coherent manner. The two phases belong to the face-centered cubic structure. , their lattice constants are very close, and the lattice constants of the γ / γ′ two-phase solid solution alloy elements will change, but their lattice constants still change between 0.352 and 0.364nm, so the crystal of the two phases Lattice mismatch is usually only 10 -3 to 10 -2 After X-ray diffraction, the diffraction peaks of the two phases overlap, and it is difficult to accurately determine the position of the two-phase diffraction peaks. Therefore, the error in characterizing the mismatch degree by the conventional X-ray diffraction meth...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20
Inventor 钟万里梁永纯虞月荣任维丽林介东聂铭丹红兵黄丰
Owner ELECTRIC POWER RES INST OF GUANGDONG POWER GRID
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com