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A kind of particle size and concentration light scattering measurement method

A light scattering measurement and particle technology, applied in transmittance measurement, measurement device, particle size analysis, etc., can solve the problem of stray light affecting measurement accuracy, and achieve the effects of improving reliability and accuracy, easy calibration, and simple algorithm

Active Publication Date: 2017-06-20
NANJING INST OF MEASUREMENT & TESTING TECH
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  • Abstract
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  • Application Information

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Problems solved by technology

In actual engineering measurement, particles adhere to the optical window of the measurement area, causing a large amount of stray light to affect the measurement accuracy

Method used

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  • A kind of particle size and concentration light scattering measurement method
  • A kind of particle size and concentration light scattering measurement method
  • A kind of particle size and concentration light scattering measurement method

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Experimental program
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Embodiment Construction

[0040] The present invention will be further described below in conjunction with the accompanying drawings.

[0041] Such as figure 1 As shown, the laser emitted by the laser and the spatial filter 1 filters the non-parallel stray light in the laser beam, and the diffused beam passes through the collimator lens 2 to form a beam of parallel light. The parallel beam passes through the dust-containing gas-solid two-phase mixed fluid 3, and the parallel beam passes through the solid particles in the fluid to generate scattered light and transmitted light. After passing through the collecting lens 4, the scattered light and transmitted light are focused on the focal plane of the collecting lens 4, the focal plane Place multi-component optical fiber distribution plate 5 on it. The optical signal collected by the optical fiber distribution board 5 is transmitted to the photoelectric conversion system 6 through the optical fiber, and converted into a current signal. The current signa...

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Abstract

The invention discloses a particle size light scattering measurement method, which includes the following steps: Step 1: Measure the light intensity change value as IΔtΣ(θ1)=It+ΔtΣ(θ1)-ItΣ(θ1), IΔtΣ(θ2)=It+ ΔtΣ(θ2)-ItΣ(θ2); Step 2: Measurement of particle size distribution. Substitute the light intensity change values ​​of the two scattering angles into the following formula to obtain the particle size distribution function. Step 3: Measurement of average particle size, The average particle size D30 can be obtained by substituting the light intensity change values ​​IΔΣ(θ1) and IΔΣ(θ2) of the two scattering angles into the following formula. The invention provides a method for measuring particle size and concentration light scattering. The measurement process is simple and easy to calibrate, without the need to predict any of the parameters. It also proposes a two-time measurement method to avoid the impact of window contamination on the measurement results in solving the particle size distribution. .

Description

technical field [0001] The invention relates to a particle size and concentration light scattering measurement method, which belongs to the technical field of particle measurement. Background technique [0002] Particle measurement plays an important role in energy research, environmental protection, atmospheric science and other fields. Because of its important position, there are many kinds of particle measurement technologies that have been developed, such as mechanical method, inductive capacitance method, ultrasonic method, optical method Wait. In recent decades, due to the development of laser technology, computer technology and optical fiber technology, optical methods have been developed rapidly, including light scattering methods. The basis of light-scattering particle measurement is the Mie scattering theory, which is a rigorous physical understanding of the scattering of electromagnetic waves by spherical particles. [0003] The more mature method of optically m...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N15/02G01N21/59
CPCG01N15/0211G01N15/06G01N2015/0046G01N15/075
Inventor 林学勇李舒许传龙张宸瑜
Owner NANJING INST OF MEASUREMENT & TESTING TECH