Universal magnetic force micromanipulation system and method for gas and liquid

A micromanipulation and magnetic force technology, applied in the field of microscopy, can solve the problems of inapplicability of magnetic atomic force microscopes, and achieve the effects of simple installation and operation, increased adjustable range and reasonable structure

Active Publication Date: 2015-05-06
CHANGCHUN UNIV OF SCI & TECH
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

The physiological environment is the most widely used research environment in the biomedical field. However, the traditional magnetic atomic force microscope is not suitable for the liquid phase environment. Therefore, the current

Method used

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  • Universal magnetic force micromanipulation system and method for gas and liquid
  • Universal magnetic force micromanipulation system and method for gas and liquid
  • Universal magnetic force micromanipulation system and method for gas and liquid

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Embodiment Construction

[0032] combine figure 1 Describe this embodiment, a gas-liquid universal magnetic force micromanipulation system described in this embodiment mainly includes a magnetic probe 1, a gas-liquid isolation probe frame 2, a probe frame clamping and horizontal adjustment frame 3, a laser 4. Mirror 10 , photosensitive position sensor 5 , XYZ nanometer displacement stage 6 and XYZ micrometer displacement stage 7 . The magnetic probe 1 is installed on the gas-liquid isolation probe frame 2, and the signal generator generates a vibration signal to drive the probe to vibrate so that it works near the resonance frequency. The gas-liquid isolation probe frame is installed on the probe frame clamping and On the horizontal adjustment frame 3, the laser 4 is irradiated on the surface of the backlight substrate of the probe 1 through the gas-liquid spacer on the probe frame, and the reflected laser is reflected to the mirror 10 through the gas-liquid spacer, and then reaches the photosensitive ...

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Abstract

The invention provides a universal magnetic force micromanipulation system and method for gas and liquid. The system comprises a magnetic probe, a gas-liquid isolation probe frame, a probe frame clamping and levelness adjustment frame, a laser, a photosensitive position sensor, XYZ nanometer and micron electrical control displacement stages and a feedback controller. The gas-liquid isolation probe frame can effectively isolate air and liquid during working under a liquid-phase environment to guarantee a working environment to be fully liquid-phase; the probe frame clamping and levelness adjustment frame can realize stable clamping and levelness adjustment of the probe frame; the XYZ nanometer and micron electrical control displacement stages and the feedback controller are used for changing a position of a sample to realize morphological and magnetic imaging of the sample. The universal magnetic force micromanipulation system and method for gas and liquid can realize morphological and magnetic domain distribution observation, analysis and manipulation of magnetic samples under gas-phase and liquid-phase environments, and are applicable to various biological materials and magnetic materials. The system structure is simple, the technique is easy to realize and the system can be widely applied in fields of biomedical and material tests.

Description

technical field [0001] The invention relates to a magnetic force microscope system, in particular to a magnetic force microscopic imaging manipulation system and method suitable for both gas-phase environment and liquid-phase environment, and belongs to the field of microscopes. Background technique [0002] Since its invention in the 1990s, the magnetic force microscope has developed rapidly and has become a powerful tool for observing the magnetic domain structure of magnetic samples. The magnetic force microscope is developed based on the secondary imaging technology of the atomic force microscope. Its working principle is to scan the same position of the sample twice in the tapping mode. The first scan obtains the shape of the sample through the interaction force between atoms Image, the second scan is based on the first scan to raise a certain height, generally 10-200nm, through the deformation of the probe cantilever to sense the magnetic interaction force between the ...

Claims

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Application Information

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IPC IPC(8): A61B19/00
CPCG01Q60/50
Inventor 王作斌刘劲芸李大有王国梁巩略曲英敏于淼董莉彤宋正勋翁占坤
Owner CHANGCHUN UNIV OF SCI & TECH
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