Method for observing morphology of ultrafine powder sample by using scanning electron microscope

An electron microscope, ultra-fine powder technology, applied in the direction of analyzing materials, instruments, etc., to achieve good dispersion, good effect, and good detection selectivity.
CN104990840AInactive Publication Date: 2015-10-21OCEAN UNIV OF CHINA
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
OCEAN UNIV OF CHINA
Publication Date
2015-10-21
Estimated Expiration
Not applicable · inactive patent

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Abstract

The objective of the invention is to provide an analytical method for observing the morphology of an ultrafine powder sample by using a scanning electron microscope. The method provided by the invention comprises the following steps: 1) adsorbing the ultrafine powder sample by using an electrostatically charged smooth surface of an adsorbate; 2) bonding powder adsorbed onto the adsorbate, i.e., a film, with one side of a double-sided conducting adhesive tape; 3) adhering the other side of the double-sided conducting adhesive tape onto a sample table of the scanning electron microscope; 4) carrying out gold plating on the powder adhered on the double-sided conducting adhesive tape; and 5) carrying out observation with the scanning electron microscope. With the method, a part of powder with a uniform particle size in the ultrafine powder sample can be obtained, the powder adsorbed under the action of electrostatic attraction is fine particles in the ultrafine powder sample, and only particles with similar particle sizes can be adsorbed at the same time, so a picture with uniform granularity can be obtained in observation with the scanning electron microscope.
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Description

technical field

[0001] The invention belongs to the technical field of electron microscope detection, and in particular relates to a method for observing the morphology of an ultrafine powder sample with a scanning electron microscope. Background technique

[0002] As an advanced analysis and testing instrument, the scanning electron microscope is mainly used for microscopic morphology observation and preliminary determination of components. It has the characteristics of simple sample preparation, adjustable magnification, wide range, and large depth of field. It has been widely used in materials It is a basic instrument widely used in modern scientific research in the fields of fracture analysis, micro-region composition analysis, various coating surface topography analysis, layer thickness measurement, microstructure topography and nano-material analysis.

[0003] Ultrafine powder refers to the powder whose particle size is less than 10 μm. It was Ryoji Ueda of Japan who ...

Claims

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