Check patentability & draft patents in minutes with Patsnap Eureka AI!

Method for improving sensitivity of surface plasmon resonance sensor

A sensor and sensitivity technology, applied in the field of measurement, can solve problems such as the influence of system sensitivity

Inactive Publication Date: 2015-12-30
SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
View PDF5 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, we found in the research that in addition to the film structure of SPR, the spectral response curve of the spectral SPR sensor will also affect the sensitivity of the actual system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for improving sensitivity of surface plasmon resonance sensor
  • Method for improving sensitivity of surface plasmon resonance sensor
  • Method for improving sensitivity of surface plasmon resonance sensor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0039] Embodiments of the present invention provide a method for improving the sensitivity of an SPR sensor, comprising the steps of:

[0040] Step (1), providing a light source and a detector, and obtaining a first spectral response curve of the light source and detector, wherein, within the wavelength range of the first spectral response curve, the spectral response characteristic decreases monotonously with increasing wavelength.

[0041] The light source can be, for example, a tungsten-halogen lamp, a xenon lamp, or an LED. In this embodiment, a tungsten-halogen lamp (Daheng Optoelectronics GCI-060101M, 150W) is selected.

[0042] The detector is, for example, a silicon-based CCD, CMOS, or photodiode array. In this embodiment, a silicon-based CCD camera (QimaingQClick1394) is selected.

[0043] The SPR sensor described in this embodiment is a spectral SPR sensor.

[0044] Obtain the overall spectral response curve of the light source and the detector, and select the first s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for improving the sensitivity of a surface plasmon resonance sensor based on a spectral response curve. The method comprises the steps that the first spectral response curve monotonically decreasing within a selected wavelength range is obtained; the incident angle of the SPR sensor is adjusted, so that within a preset refractometry range, the resonant wavelength of the SPR is within the wavelength range of the spectral response curve and is better at the end of the long wave; the position of the resonant wavelength of the SPR is judged directly through original spectral data of a system, and adopted as output data of the sensor, and therefore the sensitivity of the spectral type SPR sensor is improved.

Description

technical field [0001] The invention belongs to the field of measurement technology, in particular to a method for improving the sensitivity of an SPR (surface plasmon resonance) sensor, more specifically, to a method for improving the sensitivity of an SPR (surface plasmon resonance) sensor based on a spectral response curve method. Background technique [0002] The surface plasmon resonance (SPR) sensing method is a highly sensitive and label-free sensing method, which has been widely used in biology, chemistry, environment, clinical and other fields (ChemRev, 2008, 108:462–493 ). [0003] This method uses a special SPR excitation device (such as a layer of metal film coated on the inclined surface of a prism) to detect the relationship between the intensity, phase, wavelength and incident angle of reflected light, and can achieve a better than 10 -5 to 10 -7 (refractive index unit, RIU) resolution detects the change of the refractive index on the surface of the metal f...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N21/552G01N21/41
Inventor 刘乐陈振翎何永红郭继华
Owner SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com