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A kind of mcu calibration method and system

A calibration method and technology to be calibrated, applied in the detection of faulty computer hardware, etc., can solve the problems of affecting the operation effect of the MCU, the change of the MCU parameters, and reducing the accuracy of the results, so as to achieve simple manufacturing process, reduce chip cost, and avoid the occurrence of effect of influence

Active Publication Date: 2019-11-15
GIGADEVICE SEMICON (BEIJING) INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The present invention provides a kind of calibration method and system of MCU, in order to solve the problem that integrating OTP in MCU makes MCU increase larger area, manufacturing process is complicated, and the problem that produces error probability increases, and when MCU is applied after leaving the factory, due to Changes in the application environment lead to changes in the parameters of the MCU, which affects the operation of the MCU and reduces the accuracy of the results

Method used

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  • A kind of mcu calibration method and system
  • A kind of mcu calibration method and system
  • A kind of mcu calibration method and system

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Experimental program
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Embodiment 1

[0030] In the embodiment of the present invention, the MCU is connected to the non-volatile memory, and the MCU includes a calibration control unit and a module to be calibrated.

[0031] refer to figure 1 , shows a flow chart of the steps of an MCU calibration method according to Embodiment 1 of the present invention. The method may include the steps of:

[0032] Step 101, during the pre-delivery test of the MCU, during the operation of the MCU, receive test and calibration information, and use the test and calibration information to perform a test and calibration operation on the module to be calibrated.

[0033] What is described in the embodiment of the present invention is the calibration process of the MCU when the MCU is tested before leaving the factory, that is, the test calibration process. During the operation of the MCU, the test calibration information can be received. The test calibration information includes test calibration data required for the test calibra...

Embodiment 2

[0047] In the embodiment of the present invention, the non-volatile memory is described as an example of a flash memory chip, but the embodiment of the present invention is not limited to the non-volatile memory of the flash memory chip, any other non-volatile memory can be It works.

[0048] First, introduce the overall structure of the MCU in the embodiment of the present invention, as figure 2 As shown, the MCU may include: a system bus 21 , a flash memory controller 22 , a Static Random Access Memory (SRAM) 23 and a module 24 to be calibrated. The MCU is connected to the flash memory chip 25, and the MCU and the flash memory chip can be independent from each other and physically connected externally, or the flash memory chip can be integrated in the MCU.

[0049] In the embodiment of the present invention, the flash memory chip includes two parts: the program data part, which is used to store the program data of the MCU, and the program data is used for the programs and ...

Embodiment 3

[0141] refer to Figure 5 , shows a structural block diagram of an MCU calibration system according to Embodiment 3 of the present invention. The system may include: an MCU 51 and a non-volatile memory 52 connected to the MCU. In the embodiment of the present invention, the MCU and the non-volatile memory may be independent of each other and physically connected externally, or the non-volatile memory may permanent memory is integrated in the MCU. The MCU 51 may include a module to be calibrated 5101 .

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Abstract

The invention discloses an MCU (Micro Control Unit) calibration method and system. The method comprises the steps of when an MCU is tested before leaving a factory, in a running process of the MCU, receiving test calibration information and performing test calibration operation on a to-be-calibrated module by utilizing the test calibration information; when the test calibration is passed, writing the test calibration information into a nonvolatile memory; when the MCU is applied after leaving the factory, after the MCU is subjected to power-on reset, reading the test calibration information in the nonvolatile memory; in the running process of the MCU, receiving adjustment calibration information, and performing adjustment calibration operation by utilizing the test calibration information and the adjustment calibration information; and when the adjustment calibration is not passed, returning to receive the adjustment calibration information, and performing adjustment calibration operation on the to-be-calibrated module by utilizing the test calibration information and the adjustment calibration information. According to the method and system, the calibration time is shortened, the influence on the running effect of the MCU can be avoided, and the result accuracy can be improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to an MCU calibration method and system. Background technique [0002] MCU (Micro Control Unit, Micro Control Unit), also known as SCM (Single Chip Microcomputer, single-chip microcomputer) or single-chip microcomputer, refers to the computer CPU (Central Processing Unit, Central processing unit), RAM (Random Access Memory, random access memory), ROM (Read-Only Memory, read-only memory), timer counter and various I / O interfaces are integrated on a chip to form a chip-level computer, providing different Do different combination control for different application occasions. [0003] In MCU production, it is generally necessary to perform some tests on the MCU (such as scan chain test, functional test, etc.), reject unqualified chips, and retain MCUs whose performance meets the requirements. And due to the uncertainty of the manufacturing process, there may be differences ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 王南飞李宝魁
Owner GIGADEVICE SEMICON (BEIJING) INC
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