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On-chip controller and control method of scanning ion conductance microscope

A technology of scanning ion conductance and control method, which is applied in the field of scanning ion conductance microscope imaging control, can solve the problems of low resolution and imaging quality of scanning ion conductance microscope, complex structure of control system, poor signal integrity, etc., and improve control accuracy and imaging quality, flexible design, and fast positioning

Active Publication Date: 2018-08-10
杭州信畅信息科技有限公司
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Problems solved by technology

[0003] The structure of the traditional control system is complicated. Due to the large number of electronic components, electromagnetic interference is generated between the electronic components, resulting in poor signal integrity, and the resolution and imaging quality of the scanning ion conductance microscope are not high.

Method used

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  • On-chip controller and control method of scanning ion conductance microscope
  • On-chip controller and control method of scanning ion conductance microscope
  • On-chip controller and control method of scanning ion conductance microscope

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Embodiment Construction

[0048] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0049] Such as figure 1 As shown, the on-chip controller of the scanning ion conductance microscope provided by the present invention mainly includes: FPGA-based programmable on-chip control system (SOPC system), ion current amplifier, X, Y, Z direction piezoelectric ceramic servo controller, X, Y, Z direction high-precision micro DC motor controller and scanning ion conductance microscope platform.

[0050] Among them, FPGA-based programmable on-chip control system uses a single FPGA chip to complete the main logic functions of the system. Specifically, the logic function IP modules included are: Xilinx's soft CPU IP core MicroBlaze, MicroBlaze's debugging module MDM IP core, and AXI bus IP Core, system interrupt control IP core, timer IP core, LED driver IP core, UART IP core, SPI_Flash driver IP core, ADC and DAC driver IP core, LCD display driver IP cor...

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Abstract

The invention provides an on-chip controller of a scanning ion conductance microscope and a control method. Main logic function modules required by a scanning ion conductance microscope control system are integrated on one programmable logic device, so that the design of the control system can be converted to a chip-level system design from a traditional board-level system design. The on-chip controller and the control method of the invention are used for control on the imaging of the scanning ion conductance microscope; the chip-level system design and accurate optimization of fuzzy adaptive PID control are realized, so that the electromagnetic interference and signal integrity of the control system can be improved, and requirements for the precision of the control system can be satisfied, and imaging quality can be improved; and the programmable on-chip control system has characteristics of single-chip design, low power consumption, micro encapsulation and the like, and therefore, the number of ICs on a PCB can be effectively reduced, and the electromagnetic interference and signal integrity of the control system can be significantly improved, and the requirements for the precision of the control system can be satisfied.

Description

【Technical field】 [0001] The invention belongs to the field of imaging control of a scanning ion conductance microscope, and relates to an on-chip controller and a control method of a scanning ion conductance microscope. 【Background technique】 [0002] Scanning ion conductance microscope is a new type of scanning probe microscope after optical microscope, electron microscope and atomic force microscope. It has the advantages of high resolution, non-contact and three-dimensional acquisition of the structure and physiological characteristics of biological samples. It is widely used in the field of biomedicine. It has important application value and broad development prospect. Its basic functional principle is as figure 2 Shown: An Ag / AgCl electrode is placed in a microglass tube filled with electrolyte as a scanning probe, and a non-conductive sample is placed at the bottom of a petri dish filled with electrolyte. When the scanning probe is close to the sample surface, the i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05D3/12G01Q60/44
CPCG01Q60/44G05D3/12
Inventor 庄健赵安东尚春阳
Owner 杭州信畅信息科技有限公司