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Super-resolution microscopy method based on dual-mode competition stimulation and super-resolution microscopy device based on dual-mode competition stimulation

A super-resolution and dual-mode technology, applied in the field of super-resolution, can solve the problems of slow imaging speed, high optical power, complex imaging system, etc., and achieve the effect of simple device, convenient operation, and reduced light-emitting area

Active Publication Date: 2016-09-28
江苏度微光学科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, the resolution of STED microscopy is determined by the optical power of the added loss light. Therefore, when achieving high resolution, the required optical power is very strong, which easily leads to the bleaching of fluorescent molecules.
SIM microscopy does not require high optical power, but due to the need for raster scanning, the imaging speed is slow and the imaging system is relatively complicated.
The imaging speed of STORM microscopy is also very slow, and it is currently difficult to apply it to the real-time detection of living cells

Method used

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  • Super-resolution microscopy method based on dual-mode competition stimulation and super-resolution microscopy device based on dual-mode competition stimulation
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  • Super-resolution microscopy method based on dual-mode competition stimulation and super-resolution microscopy device based on dual-mode competition stimulation

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Embodiment Construction

[0059] The present invention will be described in detail below in conjunction with the embodiments and accompanying drawings, but the present invention is not limited thereto.

[0060] Such as figure 1 As shown, the super-resolution microscopy device of this embodiment includes: a laser 1, a single-mode fiber 2, a collimator lens 3, a 1 / 2 wave plate 4, a polarization beam splitter 5, a spatial light modulator 6, and an acousto-optic modulation Device 7, polarization beam combiner 8, 1 / 4 wave plate 9, 1 / 4 wave plate 10, dichroic mirror 11, scanning galvanometer 12, scanning lens 13, field lens 14, microscope objective lens 15, sample stage 16, Bandpass filter 17, focusing lens 18, pinhole 19, detector 20.

[0061] Wherein, the single-mode fiber 2, the collimating lens 3, the 1 / 2 wave plate 4, the polarization beam splitter 5, and the spatial light modulator 6 are sequentially located on the optical axis of the laser 1 outgoing beam; the 1 / 2 wave plate 4 The direction of the l...

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Abstract

The invention discloses a super-resolution microscopy method based on dual-mode competition stimulation and a super-resolution microscopy device based on dual-mode competition stimulation. The method comprises the following steps of: irradiating the surface of a fluorescent sample by use of two types of modulated light beams emitted from a same light source, wherein one light beam is focused to form high-energy hollow light spot on the sample after passing through a spatial light modulator, so as to generate a saturation effect, and the other light beam is modulated into pulsed light by an acousto-optic modulator so as to be focused to form low-energy solid light spots on the sample; and collecting signal lights emitted from each scanning point of the sample, and extracting the signal lights which have same frequency with the pulsed light, wherein the extracted signal lights serve as effective signal lights for acquiring super-resolution images. The device is simple, and convenient to operate; by use of the competitive mechanism of the solid light spots and the hollow light spots during a process of stimulating sample fluorescent, the resolution ratio for saturated fluorescence to stimulate an ultra-diffraction limit is realized by only using one laser light source.

Description

technical field [0001] The invention belongs to the field of super-resolution, and in particular relates to a super-resolution microscopic method and device for realizing super-diffraction-limited resolution in the far field by utilizing the principle of fluorescence saturation. Background technique [0002] Due to the effect of diffraction from the optical system, there is a limit to the resolution achievable by conventional far-field optical microscopy methods. According to Abbe's diffraction limit theory, the size of the spot formed by the beam focused by the microscope objective lens is expressed as Where λ is the operating wavelength of the microscope, and NA is the numerical aperture of the microscope objective used. Therefore, the limiting resolution of conventional far-field optical microscopes is generally limited to about half a wavelength. [0003] In order to break through the limitation of the optical diffraction limit and improve the resolution of the micros...

Claims

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Application Information

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IPC IPC(8): G01N21/64
CPCG01N21/6402
Inventor 刘旭郑程赵光远匡翠方
Owner 江苏度微光学科技有限公司
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