Novel uncooled infrared focal plane detector pixel and fabrication method thereof
A focal plane detector and uncooled infrared technology, which is applied in the manufacture of electrical components, semiconductor devices, final products, etc., can solve the problem of limited resonant cavity height, limited infrared wavelength range, and inability to meet the pixel requirements of high absorption rate detectors, etc. problem, achieve the effect of preventing breakage or warping
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[0074] The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.
[0075] A method for manufacturing a novel uncooled infrared focal plane detector pixel, comprising the following steps:
[0076] Step 1: If figure 1 As shown, a semiconductor substrate 1 comprising a readout circuit (not shown) is provided, a metal layer is deposited on the semiconductor substrate 1; and the metal layer is patterned to form a metal reflective layer 2 pattern and a metal electrode Block 3, the thickness of the metal reflective layer 2 is 0.05-0.40 μm; the metal electrode block 3 is electrically connected to the readout circuit on the semiconductor substrate 1; an insulating dielectric layer 4 is deposited on the patterned metal layer, and the insulating dielectric layer 4 is Silicon nitride film or ...
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