Compound fault diagnosis method for clamping diodes and supporting capacitors of inverter
A technology of clamping diodes and compound faults, which is applied in the fields of instruments, measuring electricity, measuring electrical variables, etc., can solve the problems that the compound fault diagnosis method is rarely raised, and achieve the effect of real-time diagnosis, fast optimization speed, and easy characterization.
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[0043] Below in conjunction with accompanying drawing, technical scheme of the present invention is described in further detail:
[0044] The method of the present invention provides a three-level inverter circuit, such as figure 1 As shown, the specific structure is: it includes a three-phase bridge arm circuit and two DC voltage sources, wherein each phase bridge arm includes four power transistor IGBTs connected in series and two clamping diodes connected in parallel at both ends of the IGBT, and the clamping diode consists of From top to bottom, from left to right, they are labeled D1, D2, D3, D4, D5, D6. The DC voltage source includes two DC support capacitors, labeled C1 and C2.
[0045] The present invention is achieved through the following methods and steps:
[0046] The first step is to measure the voltage across the DC support capacitor of the inverter under no fault conditions, such as figure 2 As shown, it can be seen that the voltage across the supporting capac...
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