Online test device and method of integrated circuit

Abstract

The invention discloses an online test device and method of an integrated circuit. The test device comprises a single-chip microcomputer, an address decoding circuit, a data caching circuit, a test driving circuit, a relay device interface circuit, a voltage comparison circuit, a sampling circuit and a threshold circuit; an instant heavy current is input into or output from the input level of a tested device, so that the potential is increased or decreased according to requirements, test output response of the tested device is collected and compared, and fault information and fault position of the tested device are determined. Online test for components in the integrated circuit is realized, test is intelligent and efficient, the measuring accuracy is high, the integrated circuit is avoided from damage in the dismounting process of offline test, problems, as weakening of a current driving capability, which cannot be tested unless in the power-on state of the components of the integrate circuit can be tested, test functions are more comprehensive, and the testing efficiency and performance of the integrated circuit are further improved.

Description

technical field [0001] The invention relates to the technical field of rolling integrated circuit testing, in particular to an integrated circuit online testing device and testing method. Background technique [0002] Cigarette automation equipment is mainly composed of integrated circuits. Due to the limitations of the manufacturing process, service life and working conditions, the chips in the integrated circuits will malfunction and affect the operation of the equipment. The measurement of integrated circuits is the process of obtaining quantitative information on chips through experimental methods, that is, the process of quantitative concepts. Based on electronic technology, functional verification and functional index testing of integrated circuits are carried out. The working process of automated integrated circuit testing is to use test software in the computer to write the test program of the chip to be tested, and after the test vector is processed by the decoding ...

AI Technical Summary

Problems solved by technology

However, the off-line test needs to disassemble the on-site integrated circuit, and the disassembly process will cause unintentional damage to the device under test, and the change of the working environment of the device will also bring about the change of the working state of the device under test, and the off-line test method is very difficult. It is difficult to detect the failure of the chip's current drive capability weakened due to the complicated circuit board connection

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