Online test device and method of integrated circuit

An on-line testing and integrated circuit technology, which is applied in the direction of electronic circuit testing, measuring devices, measuring electronics, etc., can solve problems such as chip current drive capability weakening faults, device damages, etc., to achieve comprehensive detection functions, improve efficiency and performance, Avoid the effect of damage

Pending Publication Date: 2017-03-22
CHINA TOBACCO HENAN IND
View PDF6 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the off-line test needs to disassemble the on-site integrated circuit, and the disassembly process will cause unintentional damage to the device under test, and the change of the working environment of the device will also bring abo

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Online test device and method of integrated circuit
  • Online test device and method of integrated circuit
  • Online test device and method of integrated circuit

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0025] The present invention includes an integrated circuit online testing device, such as figure 1 As shown, it includes a single chip microcomputer, an input signal processing circuit, a threshold circuit, a test drive circuit, a relay device interface circuit, a sampling circuit, a voltage comparison circuit, and an output signal processing circuit; the input signal processing circuit includes a bus drive circuit and an address decoding circuit And an input data buffer circuit, and the output signal processing circuit includes a second data buffer circuit, an address decoding circuit and a bus driving circuit;

[0026] The output terminal of the single-chip microcomputer is connected with the first input terminal of the bus driving circuit, the input terminal of the single-chip microcomputer is connected with the first output terminal of the bus driving circuit, and the second output terminal of the bus driving circuit is connected with the input terminal of the address decoding...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Inductance valueaaaaaaaaaa
Capacitanceaaaaaaaaaa
Login to view more

Abstract

The invention discloses an online test device and method of an integrated circuit. The test device comprises a single-chip microcomputer, an address decoding circuit, a data caching circuit, a test driving circuit, a relay device interface circuit, a voltage comparison circuit, a sampling circuit and a threshold circuit; an instant heavy current is input into or output from the input level of a tested device, so that the potential is increased or decreased according to requirements, test output response of the tested device is collected and compared, and fault information and fault position of the tested device are determined. Online test for components in the integrated circuit is realized, test is intelligent and efficient, the measuring accuracy is high, the integrated circuit is avoided from damage in the dismounting process of offline test, problems, as weakening of a current driving capability, which cannot be tested unless in the power-on state of the components of the integrate circuit can be tested, test functions are more comprehensive, and the testing efficiency and performance of the integrated circuit are further improved.

Description

technical field [0001] The invention relates to the technical field of rolling integrated circuit testing, in particular to an integrated circuit online testing device and testing method. Background technique [0002] Cigarette automation equipment is mainly composed of integrated circuits. Due to the limitations of the manufacturing process, service life and working conditions, the chips in the integrated circuits will malfunction and affect the operation of the equipment. The measurement of integrated circuits is the process of obtaining quantitative information on chips through experimental methods, that is, the process of quantitative concepts. Based on electronic technology, functional verification and functional index testing of integrated circuits are carried out. The working process of automated integrated circuit testing is to use test software in the computer to write the test program of the chip to be tested, and after the test vector is processed by the decoding ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/28
CPCG01R31/2836G01R31/2851
Inventor 李秀芳郑智毅王德吉赵春元张旭丁松峰范伟杨意汪翠兰李明伟李振爱
Owner CHINA TOBACCO HENAN IND
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap