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Manufacturing method of semiconductor light emitting device

A manufacturing method and technology for a light-emitting device, which are applied to semiconductor devices, semiconductor/solid-state device parts, electric solid-state devices, etc., can solve the problems of low hydrogen sulfide gas barrier, high gas permeability, and reduced brightness of semiconductor light-emitting elements.

Inactive Publication Date: 2019-07-16
SUMITOMO CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the cured product of the silicone resin composition has high air permeability and low barrier properties to hydrogen sulfide gas in the air.
Therefore, when the cured product of the silicone resin composition is used for sealing, the silver film serving as the back reflector of the sealed semiconductor light-emitting element is corroded by hydrogen sulfide in the air, and there is a problem that the brightness of the semiconductor light-emitting element decreases.

Method used

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  • Manufacturing method of semiconductor light emitting device
  • Manufacturing method of semiconductor light emitting device
  • Manufacturing method of semiconductor light emitting device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0119] As the silicone resin, resin 1 having an organopolysiloxane structure represented by the above formula (1) (weight average molecular weight = 3500, in the formula (1), R 1 = Methyl, R 2 = methoxy or hydroxyl). Table 1 shows the abundance ratio of each repeating unit of resin 1. Resin 1 is a silicone resin substantially containing only silicon atoms bonded to three oxygen atoms.

[0120] [Table 1]

[0121] Resin 1

[0122]

[0123] Measure the 1000~1050cm of resin 1 -1 The peak position of the infrared absorption spectrum from the Si-O-Si bond, the result is 1016.3cm -1 . The infrared absorption spectrum was measured under the following conditions.

[0124]

[0125] Device name: VARIAN Co., Ltd. 670

[0126] Accessories: GOLDEN GATE diamond ATR

[0127] Measurement wavelength: 4000~700cm -1

[0128] Resolution: 4cm -1

[0129] Background Measurements: Atmosphere

[0130] Cumulative times: 32 times

[0131] Put 354 g of the above-mentioned resin 1 and ...

Embodiment 2

[0146] Except having used the following resin 3 as a silicone resin instead of resin 1, it carried out similarly to Example 1, and manufactured the member for optical semiconductor sealing.

[0147] Resin 3 has an organopolysiloxane structure represented by the above formula (1) (weight average molecular weight=3000, in the formula (1), R 1 = Methyl, R 2 = hydroxyl or ethoxy). Table 3 shows the abundance ratio of each repeating unit of resin 3. Me in the table is a methyl group, R is a hydrogen atom or an ethyl group, and the ratio of the hydrogen atom to the ethyl group is 96:4.

[0148] Resin 3 is a silicone resin substantially containing only silicon atoms bonded to three oxygen atoms.

[0149] [table 3]

[0150] Resin 3

[0151]

[0152] Measure the 1000~1050cm of the resin 3 -1 The peak position of the infrared absorption spectrum from the Si-O-Si bond, the result is 1018.2cm -1 . In addition, the thickness of 950 to 1050 cm of the optical semiconductor sealing m...

Embodiment 3

[0154] A semiconductor sealing member was produced in the same manner as in Example 1, except that a mass ratio mixture of resin 1 and the following resin D1 of 70:30 was used as the silicone resin.

[0155] Resin D1 has an organopolysiloxane structure represented by the following formula (4) (weight average molecular weight = 2100), which corresponds to R in the formula (2) 1 = Methyl, R 2 = Methyl, R 3 = The structure of the hydroxyl group.

[0156] Chemical 5

[0157]

[0158] [wherein, Me is a methyl group, and n is an integer of 1 or more. ]

[0159] Specifically, 70 g of resin 1 and 32 g of isopropanol were put into a flask with a reflux device installed in a water bath, and stirred while refluxing the isopropanol at a liquid temperature of 80 to 85° C. Allow the resin to fully dissolve. Then, 30 g of the above-mentioned resin D1 was thrown into the solution in which the above-mentioned resin was dissolved, and stirred for 1 hour or more to dissolve it.

[0160...

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Abstract

The present invention provides a method of manufacturing a semiconductor light-emitting device, which includes: a step of coating a silicone resin composition on the surface of a semiconductor light-emitting element; The process of sealing the surface of the semiconductor light emitting element; the silicone resin composition contains 60% by mass or more with respect to the total mass of the solid content of the silicone resin composition, and the silicon atoms of the constituent components are substantially only bonded A silicone resin of silicon atoms with 3 oxygen atoms; the thermal curing is carried out under the following conditions, that is, the 1000 to 1050 cm of the silicone resin before thermal curing ‑1 The peak position of the infrared absorption spectrum from the Si‑O‑Si bond at the place is set to acm ‑1 , The 950~1050cm of the silicone resin composition after thermal curing ‑1 The peak position of the infrared absorption spectrum from the Si‑O‑Si bond at is set to bcm ‑1 , satisfy 5<a-b<20.

Description

technical field [0001] The invention relates to a manufacturing method of a semiconductor light emitting device. [0002] This application claims priority based on Japanese Patent Application No. 2014-152879 for which it applied in Japan on July 28, 2014, and uses the content for this application. Background technique [0003] In recent years, it has been proposed to use a cured product of a silicone resin composition as a sealing material for a semiconductor light emitting element. However, the cured product of the silicone resin composition has high air permeability and low barrier properties to hydrogen sulfide gas in the air. Therefore, when the cured product of the silicone resin composition is used for sealing, the silver film serving as the back reflector of the sealed semiconductor light-emitting element is corroded by hydrogen sulfide in the air, and there is a problem that the brightness of the semiconductor light-emitting element decreases. . [0004] As a sili...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/56C08G77/06C08L83/06H01L23/29H01L23/31
CPCC08G77/16C08G77/18C08L83/04H01L33/56C08L83/00C08K5/5435C08G77/06C08L83/06H01L2924/12041H01L2933/005C08G77/04C09D183/06H01L33/502
Inventor 吉川岳高岛正之
Owner SUMITOMO CHEM CO LTD