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Semiconductor Wafer Processing Process

A processing technology and semiconductor technology, which is applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as increased defects, inability to grow epitaxial layers, and influence of LED epitaxial growth structures, so as to prevent continuous increase in thickness and good The effect of the protective effect

Active Publication Date: 2020-02-21
FIRST SEMICON MATERIALS
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Problems solved by technology

After cleaning the gallium arsenide surface with SC-1 or SC-2, although the oxide layer can be removed, a new oxide layer will still be formed when the wafer is exposed to air. If the oxide layer on the cleaning surface is not completely removed, or the cleaning and corrosion surface is uneven , the formation of a new oxide layer when the wafer is exposed to air will appear irregular, so EPI-Ready cannot be achieved. In the subsequent epitaxial growth, the epitaxial layer cannot grow, or it will affect the LED epitaxial growth structure, such as increased defects. etc., the technical scheme of CN102064090B is a further improvement of the above two methods, but it still does not protect the surface of the wafer after cleaning.

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  • Semiconductor Wafer Processing Process
  • Semiconductor Wafer Processing Process

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Embodiment Construction

[0021] The technical solution will be clearly and completely described below in conjunction with the embodiments of the present invention. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0022] In the processing technology of the semiconductor wafer of the present invention, after the surface of the semiconductor wafer is cleaned, the wafer is soaked in a non-ionic surfactant solution. In some embodiments, the wafer is a gallium arsenide wafer; in some embodiments, the non-ionic surfactant The surfactant is alkylphenol polyoxyethylene ether, preferably, the non-ionic surfactant is octylphenol polyoxyethylene ether; in some embodiments, the wafer is quickly taken out after the soaking lasts for 10-15s.

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Abstract

The invention relates to a treatment process of a semiconductor chip. The treatment process of a semiconductor chip includes the steps: cleaning the surface of a semiconductor chip, and then immersing the chip in nonionic solution. The treatment process of a semiconductor chip can form a layer of physical protection film on a surface oxide layer of the surface-cleaned chip by means of the nonionics, thus effectively preventing the oxide layer contacting the oxygen in the air continuously so as to prevent continuous increasing of the thickness of the oxide layer to achieve good protection effect.

Description

technical field [0001] The invention relates to the field of semiconductor materials, in particular to a processing technology for semiconductor wafers. Background technique [0002] Group III-V compound semiconductor materials represented by gallium arsenide (GaAs) are widely used in the fields of satellite communications, microwave devices, lasers and light-emitting diodes due to their unique electrical properties. The manufacture of devices such as heterojunction bipolar transistors, high electron mobility transistors, and LEDs requires the growth of epitaxial structures on the surface of high-quality substrates by molecular beam epitaxy or organometallic compound vapor phase epitaxy. With the continuous improvement of semiconductor device manufacturing process, the size of the device is getting smaller and higher, and the utilization rate is getting higher and higher. The quality of the semiconductor substrate, especially the quality of the wafer surface, has a greater i...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/02H01L21/56
CPCH01L21/02057H01L21/56
Inventor 廖彬周铁军
Owner FIRST SEMICON MATERIALS