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Stray spectrum analysis system and analysis method based on vector network analyzer

A technology of vector network analysis and analysis method, which is applied in the field of vector network analyzer measurement, can solve the problems of high test cost and low efficiency, and achieve the effect of improving test speed, increasing dynamic range and improving accuracy

Active Publication Date: 2018-04-06
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problems of high test cost and low efficiency in the existing non-linear characteristic test of the tested part, the first purpose of the present invention is to provide a spurious spectrum analysis system based on a vector network analyzer. Analyze the nonlinear characteristics of the device to meet the user's test needs for one connection and multiple measurements, reduce test costs and improve test efficiency

Method used

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  • Stray spectrum analysis system and analysis method based on vector network analyzer
  • Stray spectrum analysis system and analysis method based on vector network analyzer
  • Stray spectrum analysis system and analysis method based on vector network analyzer

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Embodiment 1

[0036] combine Figure 1 to Figure 5 , a spurious spectrum analysis system based on a vector network analyzer, including a spurious spectrum measurement information and option setting unit, a multi-channel time-frequency domain transformation and correction unit, a spurious spectrum measurement control unit, a spurious spectrum data generation unit and Stray spectrum display correction unit;

[0037] Such as figure 1 As shown, the spurious spectrum measurement information and option setting unit is connected with the spurious spectrum measurement control unit, the spurious spectrum measurement control unit and the multi-channel time-frequency domain transformation and correction unit are all connected with the spurious spectrum data generation unit, and the spurious spectrum The data generation unit is connected with the stray spectrum display correction unit;

[0038] The spurious spectrum measurement information and option setting unit processes the user's settings into me...

Embodiment 2

[0046] The method for performing spurious spectrum analysis by utilizing the spurious spectrum analysis system includes the following steps:

[0047] Step 1: The user sets the measurement information parameters such as span width, processing bandwidth, display bandwidth, detection, local oscillator times, window function and average type through the spurious spectrum measurement and option setting unit, and the above information parameters can also be set by program control.

[0048] In order to facilitate the user to set the signal source output state, output frequency information and receiver attenuation information of each channel of the vector network analyzer, the interface provides a shortcut call method for the above information. When the source is turned on, it is the spurious spectrum of the DUT in the active excitation state information.

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Abstract

The invention provides a stray spectrum analysis system and analysis method based on a vector network analyzer. The stray spectrum analysis system includes a stray spectrum measurement information andoption setting unit, a multi-channel time-frequency domain transformation and correction unit, a stray spectrum measurement control unit, a stray spectrum data generation unit and a stray spectrum display correction unit. The response information of a measured piece under active or passive excitation is scanned multiple times through a deviation local oscillation mode by using a software algorithm, and the response information is displayed in real time on the screen of a network instrument after video detection and frequency correction. The nonlinear stray spectrum of a device is measured onthe vector network analyzer. The number of types of measurement carried out by the vector network analyzer is increased. Users can complete multiple types of measurement through one connection. The test cost is reduced, and the test efficiency is improved.

Description

technical field [0001] The invention relates to the measurement field of a vector network analyzer, in particular to a spurious spectrum analysis system and analysis method based on a vector network analyzer. Background technique [0002] Today's high-performance vector network analyzers provide a variety of measurement classes to support the testing of devices such as amplifiers, mixers, and frequency converters. For example, standard measurement classes that provide traditional parameter tests such as impedance, insertion loss, and standing wave; gain compression (inverter) measurement classes that provide parameters such as compression point input, output power, and compression point gain; Intermodulation distortion (inverter) measurement of distortion parameter test, etc. The nonlinear characteristics of devices such as amplifiers and mixers are important parameters that determine device performance. Traditionally, the nonlinear characteristics of these devices are test...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R23/16
CPCG01R23/16G01R31/00
Inventor 刘丹李树彪梁胜利袁国平杨明飞李明太郭永瑞
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP